Fault-Independent Test-Generation for Software-Based Self-Testing

Software-based self-test (SBST) is being widely used in both manufacturing and in-the-field testing of processor-based devices and Systems-on-Chips. Unfortunately, the stuck-at fault model is increasingly inadequate to match the new and different types of defects in the most recent semiconductor technologies, while the explicit and separate targeting of every fault model in SBST is cumbersome due to the high complexity of the test-generation process, the lack of automation tools, and the high CPU-intensity of the fault-simulation process. Moreover, defects in advanced semiconductor technologies are not always covered by the most commonly used fault-models, and the probability of defect-escapes increases even more. To overcome these shortcomings we propose the first fault-independent SBST method. The proposed method is almost fully automated, it offers high coverage of non-modeled faults by means of a novel SBST-oriented probabilistic metric, and it is very fast as it omits the time-consuming test-generation/fault-simulation processes. Extensive experiments on the OpenRISC OR1200 processor show the advantages of the proposed method

Shielding Performance Monitor Counters: A double edged weapon for safety and security

Recent years have witnessed the growth of the adoption of Cyber-Physical Systems (CPSs) in many sectors such as automotive, aerospace, civil infrastructures and healthcare. Several CPS applications include critical scenarios, where a failure of the system can lead to catastrophic consequences. Therefore, anomalies due to failure or malicious attacks must be timely detected. This paper focuses on two relevant aspects of the design of a CPS: safety and security. In particular, it studies how performance monitor counters (PMCs) available in modern microprocessors can be from the one hand a valuable tool to enhance the safety of a system and, on the other hand, a security backdoor. Starting from the example of a PMC based safety mechanism, the paper shows the implementation of a possible attack and eventually proposes a strategy to mitigate the effectiveness of the attack while preserving the safeness of the system

Fault-Independent Test-Generation for Software-Based Self-Testing

Software-based self-test (SBST) is being widely used in both manufacturing and in-the-field testing of processor-based devices and Systems-on-Chips. Unfortunately, the stuck-at fault model is increasingly inadequate to match the new and different types of defects in the most recent semiconductor technologies, while the explicit and separate targeting of every fault model in SBST is cumbersome due to the high complexity of the test-generation process, the lack of automation tools, and the high CPU-intensity of the fault-simulation process. Moreover, defects in advanced semiconductor technologies are not always covered by the most commonly used fault-models, and the probability of defect-escapes increases even more. To overcome these shortcomings we propose the first fault-independent SBST method. The proposed method is almost fully automated, it offers high coverage of non-modeled faults by means of a novel SBST-oriented probabilistic metric, and it is very fast as it omits the time-consuming test-generation/fault-simulation processes. Extensive experiments on the OpenRISC OR1200 processor show the advantages of the proposed method

Reliability in Power Electronics and Power Systems

L'abstract è presente nell'allegato / the abstract is in the attachmen