Proton single-event effects tolerance testing of a vision processing unit for satellite use

Abstract

Badat, S. 2025. Proton Single-Event Effects Tolerance Testing of a Vision Processing Unit for Satellite Use. Unpublished masters thesis. Stellenbosch: Stellenbosch University [online]. Available: https://scholar.sun.ac.za/items/ab66f6c1-dc89-48a2-ba4c-37f9d0e09a07Thesis (MEng)--Stellenbosch University, 2025.ENGLISH ABSTRACT: This thesis investigates the Single Event Effects (SEE) susceptibility of the Intel Movidius Myriad X Vision Processing Unit (VPU) when exposed to 66 MeV protons. The research makes use of an industry-standard computer vision model and a custom neural network designed specifically for SEE detection to perform testing with only API-level access to the device. Testing was performed using the YOLOv7-tiny object detection model and a custom single-layer network (PlusOne) designed to trace error propagation. The Myriad X exhibited SEE cross-sections in the range of 10−11 to 10−9 cm2 , with functional failure occurring at approximately 65.77 krad(Si). While numerous Single Event Upsets (SEUs) were observed, post-processing techniques proved effective at filtering many errorinduced predictions. Analysis of recurring errors provided insight into potential firmware vulnerabilities to SEE. The research also reveals opportunities for SEE-aware neural network design, suggesting that architectural modifications to networks could enhance radiation tolerance.AFRIKAANSE OPSOMMING: Hierdie tesis ondersoek die sensitiwiteit vir Enkelgebeurteniseffekte (SEE) van die Intel Movidius Myriad X Vision Verwerkingseenheid (VPU) wanneer dit blootgestel word aan 66 MeV protone. Die navorsing maak gebruik van ’n industrie-standaard rekenaarvisie-model en ’n persoonlike neurale netwerk wat spesifiek ontwerp is vir SEE-deteksie om toetsing uit te voer met slegs API-vlak toegang tot die toestel. Toetsing is uitgevoer met die YOLOv7-tiny objekdeteksiemodel en ’n persoonlike enkel-laag netwerk (PlusOne) wat ontwerp is om foutpropagasie na te spoor. Die Myriad X het SEE-deursnee-waardes tussen 10−11 tot 10−9 cm2 getoon, met funksionele mislukkings wat plaasgevind het by ongeveer 65.77 krad(Si). Terwyl talle Enkelgebeurtenis-omkerings (SEUs) waargeneem is, het na-verwerkingstegnieke effektief geblyk om baie fout-ge¨ınduseerde voorspellings uit te filter. Analise van herhalende foute het insig gebied in potensi¨ele firmware-kwesbaarhede vir SEE. Die navorsing onthul ook geleenthede vir SEE-bewuste neurale netwerkontwerp, wat daarop dui dat strukturele aanpassings aan netwerke stralingstoleransie kan verbeter.Master