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Reliability assessment and failure mode analysis of MEMS accelerometers for space applications

By I. Marozau, M. Auchlin, V. Pejchal, F. Souchon, D. Vogel, Markku Lahti, N. Saillen and O. Sereda
Topics: FMEA, MEMS, Reliability, Space application, /fi/minedu/virta/publicationtypes/a1, A1 Refereed journal article, /fi/minedu/virta/openaccess/0, 0 Not Open Access, /fi/minedu/virta/scienceareas/213, 213 Electronics, automation, information engineering, /dk/atira/pure/subjectarea/asjc/2500/2504, Electronic, Optical and Magnetic Materials, /dk/atira/pure/subjectarea/asjc/3100/3107, Atomic and Molecular Physics, and Optics, /dk/atira/pure/subjectarea/asjc/2200/2213, Safety, Risk, Reliability and Quality, /dk/atira/pure/subjectarea/asjc/3100/3104, Condensed Matter Physics, /dk/atira/pure/subjectarea/asjc/2500/2508, Surfaces, Coatings and Films, /dk/atira/pure/subjectarea/asjc/2200/2208, Electrical and Electronic Engineering
Year: 2018
DOI identifier: 10.1016/j.microrel.2018.07.118
OAI identifier: oai:cris.vtt.fi:openaire_cris_publications/b0fe78a4-6959-4266-a9c7-15b3d7012c67
Provided by: VTT Research System
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