Article thumbnail
Location of Repository

Reliability assessment and failure mode analysis of MEMS accelerometers for space applications

By I. Marozau, M. Auchlin, V. Pejchal, F. Souchon, D. Vogel, Markku Lahti, N. Saillen and O. Sereda
Topics: FMEA, MEMS, Reliability, Space application, /fi/minedu/virta/publicationtypes/a1, A1 Refereed journal article, /fi/minedu/virta/openaccess/0, 0 Not Open Access, /fi/minedu/virta/scienceareas/213, 213 Electronics, automation, information engineering, /dk/atira/pure/subjectarea/asjc/2500/2504, Electronic, Optical and Magnetic Materials, /dk/atira/pure/subjectarea/asjc/3100/3107, Atomic and Molecular Physics, and Optics, /dk/atira/pure/subjectarea/asjc/2200/2213, Safety, Risk, Reliability and Quality, /dk/atira/pure/subjectarea/asjc/3100/3104, Condensed Matter Physics, /dk/atira/pure/subjectarea/asjc/2500/2508, Surfaces, Coatings and Films, /dk/atira/pure/subjectarea/asjc/2200/2208, Electrical and Electronic Engineering
Year: 2018
DOI identifier: 10.1016/j.microrel.2018.07.118
OAI identifier:
Provided by: VTT Research System
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • (external link)
  • (external link)
  • (external link)
  • Suggested articles

    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.