We have developed a unique micromechanical method to extract extremely thin
graphite samples. Graphite crystallites with thicknesses ranging from 10 - 100
nm and lateral size ∼ 2 μm are extracted from bulk. Mesoscopic
graphite devices are fabricated from these samples for electric field dependent
conductance measurements. Strong conductance modulation as a function of gate
voltage is observed in the thinner crystallite devices. The temperature
dependent resistivity measurements show more boundary scattering contribution
in the thinner graphite samples.Comment: 3 pages, 3 figures included, submitted to Appl. Phys. Let