'Institute of Electrical and Electronics Engineers (IEEE)'
Abstract
Author name used in this publication: Y. LuAuthor name used in this publication: S. L. HoAuthor name used in this publication: J. F. PanAuthor name used in this publication: X. D. XueAuthor name used in this publication: K. W. E. ChengRefereed conference paper2005-2006 > Academic research: refereed > Refereed conference paperVersion of RecordPublishe
