146,916 research outputs found
Nanoelectromechanics of Piezoresponse Force Microscopy
To achieve quantitative interpretation of Piezoresponse Force Microscopy
(PFM), including resolution limits, tip bias- and strain-induced phenomena and
spectroscopy, analytical representations for tip-induced electroelastic fields
inside the material are derived for the cases of weak and strong indentation.
In the weak indentation case, electrostatic field distribution is calculated
using image charge model. In the strong indentation case, the solution of the
coupled electroelastic problem for piezoelectric indentation is used to obtain
the electric field and strain distribution in the ferroelectric material. This
establishes a complete continuum mechanics description of the PFM contact
mechanics and imaging mechanism. The electroelastic field distribution allows
signal generation volume in PFM to be determined. These rigorous solutions are
compared with the electrostatic point charge and sphere-plane models, and the
applicability limits for asymptotic point charge and point force models are
established. The implications of these results for ferroelectric polarization
switching processes are analyzed.Comment: 81 pages, 19 figures, to be published in Phys. Rev.
Tunneling magnetic force microscopy
We have developed a powerful new tool for studying the magnetic patterns on magnetic recording media. This was accomplished by modifying a conventional scanning tunneling microscope. The fine-wire probe that is used to image surface topography was replaced with a flexible magnetic probe. Images obtained with these probes reveal both the surface topography and the magnetic structure. We have made a thorough theoretical analysis of the interaction between the probe and the magnetic fields emanating from a typical recorded surface. Quantitative data about the constituent magnetic fields can then be obtained. We have employed these techniques in studies of two of the most important issues of magnetic record: data overwrite and maximizing data-density. These studies have shown: (1) overwritten data can be retrieved under certain conditions; and (2) improvements in data-density will require new magnetic materials. In the course of these studies we have developed new techniques to analyze magnetic fields of recorded media. These studies are both theoretical and experimental and combined with the use of our magnetic force scanning tunneling microscope should lead to further breakthroughs in the field of magnetic recording
Dynamic Behavior in Piezoresponse Force Microscopy
Frequency dependent dynamic behavior in Piezoresponse Force Microscopy (PFM)
implemented on a beam-deflection atomic force microscope (AFM) is analyzed
using a combination of modeling and experimental measurements. The PFM signal
comprises contributions from local electrostatic forces acting on the tip,
distributed forces acting on the cantilever, and three components of the
electromechanical response vector. These interactions result in the bending and
torsion of the cantilever, detected as vertical and lateral PFM signals. The
relative magnitudes of these contributions depend on geometric parameters of
the system, the stiffness and frictional forces of tip-surface junction, and
operation frequencies. The dynamic signal formation mechanism in PFM is
analyzed and conditions for optimal PFM imaging are formulated. The
experimental approach for probing cantilever dynamics using frequency-bias
spectroscopy and deconvolution of electromechanical and electrostatic contrast
is implemented.Comment: 65 pages, 15 figures, high quality version available upon reques
Crosstalk Correction in Atomic Force Microscopy
Commercial atomic force microscopes usually use a four-segmented photodiode
to detect the motion of the cantilever via laser beam deflection. This read-out
technique enables to measure bending and torsion of the cantilever separately.
A slight angle between the orientation of the photodiode and the plane of the
readout beam, however, causes false signals in both readout channels, so-called
crosstalk, that may lead to misinterpretation of the acquired data. We
demonstrate this fault with images recorded in contact mode on ferroelectric
crystals and present an electronic circuit to compensate for it, thereby
enabling crosstalk-free imaging
Depth resolution of Piezoresponse force microscopy
Given that a ferroelectric domain is generally a three dimensional entity, the determination of its area as well as its depth is mandatory for full characterization. Piezoresponse force microscopy (PFM) is known for its ability to map the lateral dimensions of ferroelectric domains with high accuracy. However, no depth profile information has been readily available so far. Here, we have used ferroelectric domains of known depth profile to determine the dependence of the PFM response on the depth of the domain, and thus effectively the depth resolution of PFM detection
Materials Contrast in Piezoresponse Force Microscopy
Piezoresponse Force Microscopy contrast in transversally isotropic material
corresponding to the case of c+ - c- domains in tetragonal ferroelectrics is
analyzed using Green's function theory by Felten et al. [J. Appl. Phys. 96, 563
(2004)]. A simplified expression for PFM signal as a linear combination of
relevant piezoelectric constant are obtained. This analysis is extended to
piezoelectric material of arbitrary symmetry with weak elastic and dielectric
anisotropies. This result provides a framework for interpretation of PFM
signals for systems with unknown or poorly known local elastic and dielectric
properties, including nanocrystalline materials, ferroelectric polymers, and
biopolymers.Comment: 20 pages, 3 figures, 1 table, accepted to Appl. Phys. Lett. (without
Appendices), algebraic errors were correcte
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