Broadband and Temperature Tolerant Silicon Nitride Liquid Controlled Waveguide Coupler

A broadband and temperature tolerant liquid- controlled adiabatic waveguide coupler (LCC) is realized. The LCC with silicon nitride (SiN) waveguides is designed to be com- patible with liquids that can be actuated by an electrowetting-on- dielectric (EWOD) system. This proof-of-principle demonstration with manual actuation paves the way towards the realization of non-volatile optical switch systems. A 630 μm long LCC configured as a 1 à 2 switch has a measured insertion loss less than 1.5 dB and a crosstalk less than -14 dB for both bar and cross state over the telecommunication wavelength range 1260 nm to 1630 nm. Furthermore, the LCC is tolerant to variations in temperature. The measured excess insertion loss over the temperature range 21°C to 73°C is less than 0.3 dB for bar and cross state, over the same wavelength range.info:eu-repo/semantics/publishe

Reliability and Failures in Solid State Lighting Systems

Reliability is an essential scientific and technological domain intrinsically linked with system integration. Nowadays, semiconductor industries are confronted with ever-increasing design complexity, dramatically decreasing design margins, increasing chances for and consequences of failures, shortening of product development and qualification time, and increasing difficulties to meet quality, robustness, and reliability requirements. The scientific successes of many micro/nano-related technology developments cannot lead to business success without innovation and breakthroughs in the way that we address reliability through the whole value chain. The aim of reliability is to predict, optimize, and design upfront the reliability of micro/nanoelectronics and systems, an area denoted as “Design for Reliability (DfR)”. While virtual schemes based on numerical simulation are widely used for functional design, they lack a systematic approach when used for reliability assessments. Besides this, lifetime predictions are still based on old standards assuming a constant failure rate behavior. In this chapter, we will present the reliability and failures found in solid-state lighting systems. It includes both degradation and catastrophic failure modes from observation toward a full description of its mechanism obtained by extensive use of acceleration tests using knowledge-based qualification methods.Electronic Components, Technology and MaterialsMechanical, Maritime and Materials Engineerin

Solutions for Extended Split PON.

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Reliability and Failures in Solid State Lighting Systems

Reliability is an essential scientific and technological domain intrinsically linked with system integration. Nowadays, semiconductor industries are confronted with ever-increasing design complexity, dramatically decreasing design margins, increasing chances for and consequences of failures, shortening of product development and qualification time, and increasing difficulties to meet quality, robustness, and reliability requirements. The scientific successes of many micro/nano-related technology developments cannot lead to business success without innovation and breakthroughs in the way that we address reliability through the whole value chain. The aim of reliability is to predict, optimize, and design upfront the reliability of micro/nanoelectronics and systems, an area denoted as “Design for Reliability (DfR)”. While virtual schemes based on numerical simulation are widely used for functional design, they lack a systematic approach when used for reliability assessments. Besides this, lifetime predictions are still based on old standards assuming a constant failure rate behavior. In this chapter, we will present the reliability and failures found in solid-state lighting systems. It includes both degradation and catastrophic failure modes from observation toward a full description of its mechanism obtained by extensive use of acceleration tests using knowledge-based qualification methods