Multi-layered flyer accelerated by laser induced shock waves

Copyright 2000 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Physics of Plasmas, 7(2), 676-680, 2000 and may be found at http://dx.doi.org/10.1063/1.87385

Organic electroluminescent diodes as a light source for polymeric integrated devices

Symposium on Integrated Optics, 2001, San Jose, CA, United StatesYutaka Ohmori, Hirotake Kajii, Takahisa Tsukagawa, Katsumi Yoshino, Masanori Ozaki, Akihiko Fujii, Makoto Hikita, Satoru Tomaru, Sabro Imamura, Hisataka Takenaka, Junya Kobayashi, and Fumio Yamamoto "Organic electroluminescent diodes as a light source for polymeric integrated devices", Proc. SPIE 4279, Organic Photonic Materials and Devices III, (15 June 2001). DOI: https://doi.org/10.1117/12.42939

Development of 2D dispersive device for XRF imaging spectrometer

Micro-XRF analysis provides us with elemental maps, which are very useful for understanding the samples under test. Usually, scanning-type elemental mapping is performed. That means, a sample stage is scanned to a fixed X-ray micro beam. XRF analysis is performed at the scanned points, leading to 2D elemental mapping. One of the drawbacks of this technique is the long acquisition time depending on the area being mapped and the lateral resolution required. Thus, projection-type elemental mapping has been studied. We have studied the projection type XRF imaging by using a straight polycapillary optic combined with an X-ray CCD camera. To obtain the elemental map, we applied a wavelength dispersive spectrometer (WDS). In this paper, we report a newly developed 2D dispersive device. The construction and analytical performance of this X-ray optic will be explained

Enhancement of X-ray fluorescence intensity from an ultra-thin sandwiched layer at grazing-emission angles

Abstract Ni ultra-thin films sandwiched with carbon thin films of different thickness are measured by a laboratory grazing-emission X-ray fluorescence instrument. The Ni K ␣ intensity of the Ni ultra-thin film sandwiched with carbon layers is three times enhanced in comparison with the Ni ultra-thin film without carbon layers. In addition, oscillations caused by interference effects of directly observed X-ray beams and the reflected X-ray beams on the surface of the Pt substrate, are clearly observed. The periods of the oscillations depends on the thickness of the carbon layer, that is, the position of the Ni layer. Therefore, the thickness of the carbon layer can be estimated.

Multilayer laminar-type diffraction gratings achieving high diffraction efficiencies in the 1-8 keV energy region

W/C and Co/SiO2 multilayer gratings have been fabricated by depositing a multilayer coating on the surface of laminar-type holographic master gratings. The diffraction efficiency was measured by reflectometers in the energy region of 0.6-8.0 keV at synchrotron radiation facilities as well as at an x-ray diffractometer at 8.05 keV. The Co/SiO2 and W/C multilayer gratings showed peak diffraction efficiencies of 0.47 and 0.38 at 4.0 and 8.0 keV, respectively. The peak efficiency of the Co/SiO2 multilayer grating is the highest measured with hard x-rays, to our knowledge. The diffraction efficiency of the Co/SiO2 multilayer gratings was higher than that of the W/C multilayer grating in the energy range of 2.5 6.0 keV. However, it decreased significantly in the energy above the K-absorption edge of Co (7.71 keV). For the Co/SiO2 multilayer grating the measured diffraction efficiencies agreed with the calculated curves assuming a rms roughness ~1 nm