11 research outputs found
Characterization of striations in silicon wafers by a multipass Fabry-Perot Rayleigh-Brillouin scattering spectrometer
No full textJournal of Materials Research9102712-2716JMRE
Microwave dielectric relaxation of silicon crystals
No full textJournal of Physics and Chemistry of Solids55111369-1373JPCS
Effect of surface structures upon ultrathin film interference fringes
No full textJournal of Materials Research892315-2318JMRE
Vacuum pump coaxial probe system for measurement of dielectric properties of materials with smooth surfaces
No full text10.1088/0957-0233/6/3/004Measurement Science and Technology63281-282MSTC
Characterization of striations in silicon wafers by a multipass Fabry-Pérot Rayleigh-Brillouin scattering spectrometer
No full textCharacterization of surface microroughness of silicon wafers by a multipass Fabry–Perot Rayleigh–Brillouin scattering spectrometer
No full text
