7 research outputs found
Air-Stable Surface Charge Transfer Doping of MoS<sub>2</sub> by Benzyl Viologen
Air-stable
doping of transition metal dichalcogenides is of fundamental
importance to enable a wide range of optoelectronic and electronic
devices while exploring their basic material properties. Here we demonstrate
the use of benzyl viologen (BV), which has one of the highest reduction
potentials of all electron-donor organic compounds, as a surface charge
transfer donor for MoS<sub>2</sub> flakes. The n-doped samples exhibit
excellent stability in both ambient air and vacuum. Notably, we obtained
a high electron sheet density of ∼1.2 × 10<sup>13</sup> cm<sup>–2</sup>, which corresponds to the degenerate doping
limit for MoS<sub>2</sub>. The BV dopant molecules can be reversibly
removed by immersion in toluene, providing the ability to control
the carrier sheet density as well as selective removal of surface
dopants on demand. By BV doping of MoS<sub>2</sub> at the metal junctions,
the contact resistances are shown to be reduced by a factor of >3.
As a proof of concept, top-gated field-effect transistors were fabricated
with BV-doped n<sup>+</sup> source/drain contacts self-aligned with
respect to the top gate. The device architecture, resembling that
of the conventional Si transistors, exhibited excellent switching
characteristics with a subthreshold swing of ∼77 mV/decade
Design of Surfactant–Substrate Interactions for Roll-to-Roll Assembly of Carbon Nanotubes for Thin-Film Transistors
Controlled
assembly of single-walled carbon nanotube (SWCNT) networks
with high density and deposition rate is critical for many practical
applications, including large-area electronics. In this regard, surfactant
chemistry plays a critical role as it facilitates the substrate–nanotube
interactions. Despite its importance, detailed understanding of the
subject up until now has been lacking, especially toward tuning the
controllability of SWCNT assembly for thin-film transistors. Here,
we explore SWCNT assembly with steroid- and alkyl-based surfactants.
While steroid-based surfactants yield highly dense nanotube thin films,
alkyl surfactants are found to prohibit nanotube assembly. The latter
is attributed to the formation of packed alkyl layers of residual
surfactants on the substrate surface, which subsequently repel surfactant
encapsulated SWCNTs. In addition, temperature is found to enhance
the nanotube deposition rate and density. Using this knowledge, we
demonstrate highly dense and rapid assembly with an effective SWCNT
surface coverage of ∼99% as characterized by capacitance–voltage
measurements. The scalability of the process is demonstrated through
a roll-to-roll assembly of SWCNTs on plastic substrates for large-area
thin-film transistors. The work presents an important process scheme
for nanomanufacturing of SWCNT-based electronics
Dual-Gated MoS<sub>2</sub>/WSe<sub>2</sub> van der Waals Tunnel Diodes and Transistors
Two-dimensional layered semiconductors present a promising material platform for band-to-band-tunneling devices given their homogeneous band edge steepness due to their atomically flat thickness. Here, we experimentally demonstrate interlayer band-to-band tunneling in vertical MoS<sub>2</sub>/WSe<sub>2</sub> van der Waals (vdW) heterostructures using a dual-gate device architecture. The electric potential and carrier concentration of MoS<sub>2</sub> and WSe<sub>2</sub> layers are independently controlled by the two symmetric gates. The same device can be gate modulated to behave as either an Esaki diode with negative differential resistance, a backward diode with large reverse bias tunneling current, or a forward rectifying diode with low reverse bias current. Notably, a high gate coupling efficiency of ∼80% is obtained for tuning the interlayer band alignments, arising from weak electrostatic screening by the atomically thin layers. This work presents an advance in the fundamental understanding of the interlayer coupling and electron tunneling in semiconductor vdW heterostructures with important implications toward the design of atomically thin tunnel transistors
Measuring the Edge Recombination Velocity of Monolayer Semiconductors
Understanding
edge effects and quantifying their impact on the
carrier properties of two-dimensional (2D) semiconductors is an essential
step toward utilizing this material for high performance electronic
and optoelectronic devices. WS<sub>2</sub> monolayers patterned into
disks of varying diameters are used to experimentally explore the
influence of edges on the material’s optical properties. Carrier
lifetime measurements show a decrease in the effective lifetime, Ï„<sub>effective</sub>, as a function of decreasing diameter, suggesting
that the edges are active sites for carrier recombination. Accordingly,
we introduce a metric called edge recombination velocity (ERV) to
characterize the impact of 2D material edges on nonradiative carrier
recombination. The unpassivated WS<sub>2</sub> monolayer disks yield
an ERV ∼ 4 × 10<sup>4</sup> cm/s. This work quantifies
the nonradiative recombination edge effects in monolayer semiconductors,
while simultaneously establishing a practical characterization approach
that can be used to experimentally explore edge passivation methods
for 2D materials
General Thermal Texturization Process of MoS<sub>2</sub> for Efficient Electrocatalytic Hydrogen Evolution Reaction
Molybdenum
disulfide (MoS<sub>2</sub>) has been widely examined
as a catalyst containing no precious metals for the hydrogen evolution
reaction (HER); however, these examinations have utilized synthesized
MoS<sub>2</sub> because the pristine MoS<sub>2</sub> mineral is known
to be a poor catalyst. The fundamental challenge with pristine MoS<sub>2</sub> is the inert HER activity of the predominant (0001) basal
surface plane. In order to achieve high HER performance with pristine
MoS<sub>2</sub>, it is essential to activate the basal plane. Here,
we report a general thermal process in which the basal plane is texturized
to increase the density of HER-active edge sites. This texturization
is achieved through a simple thermal annealing procedure in a hydrogen
environment, removing sulfur from the MoS<sub>2</sub> surface to form
edge sites. As a result, the process generates high HER catalytic
performance in pristine MoS<sub>2</sub> across various morphologies
such as the bulk mineral, films composed of micron-scale flakes, and
even films of a commercially available spray of nanoflake MoS<sub>2</sub>. The lowest overpotential (η) observed for these samples
was η = 170 mV to obtain 10 mA/cm<sup>2</sup> of HER current
density
High Luminescence Efficiency in MoS<sub>2</sub> Grown by Chemical Vapor Deposition
One
of the major challenges facing the rapidly growing field of
two-dimensional (2D) transition metal dichalcogenides (TMDCs) is the
development of growth techniques to enable large-area synthesis of
high-quality materials. Chemical vapor deposition (CVD) is one of
the leading techniques for the synthesis of TMDCs; however, the quality
of the material produced is limited by defects formed during the growth
process. A very useful nondestructive technique that can be utilized
to probe defects in semiconductors is the room-temperature photoluminescence
(PL) quantum yield (QY). It was recently demonstrated that a PL QY
near 100% can be obtained in MoS<sub>2</sub> and WS<sub>2</sub> monolayers
prepared by micromechanical exfoliation by treating samples with an
organic superacid: bisÂ(trifluoromethane)Âsulfonimide (TFSI).
Here we have performed a thorough exploration of this chemical treatment
on CVD-grown MoS<sub>2</sub> samples. We find that the as-grown monolayers
must be transferred to a secondary substrate, which releases strain,
to obtain high QY by TFSI treatment. Furthermore, we find that the
sulfur precursor temperature during synthesis of the MoS<sub>2</sub> plays a critical role in the effectiveness of the treatment. By
satisfying the aforementioned conditions we show that the PL QY of
CVD-grown monolayers can be improved from ∼0.1% in the as-grown
case to ∼30% after treatment, with enhancement factors ranging
from 100 to 1500× depending on the initial monolayer quality.
We also found that after TFSI treatment the PL emission from MoS<sub>2</sub> films was visible by eye despite the low absorption (5–10%).
The discovery of an effective passivation strategy will speed the
development of scalable high-performance optoelectronic and electronic
devices based on MoS<sub>2</sub>
Air Stable p‑Doping of WSe<sub>2</sub> by Covalent Functionalization
Covalent functionalization of transition metal dichalcogenides (TMDCs) is investigated for air-stable chemical doping. Specifically, p-doping of WSe<sub>2</sub> <i>via</i> NO<sub><i>x</i></sub> chemisorption at 150 °C is explored, with the hole concentration tuned by reaction time. Synchrotron based soft X-ray absorption spectroscopy (XAS) and X-ray photoelectron spectroscopy (XPS) depict the formation of various WSe<sub>2–<i>x</i>–<i>y</i></sub>O<sub><i>x</i></sub>N<sub><i>y</i></sub> species both on the surface and interface between layers upon chemisorption reaction. <i>Ab initio</i> simulations corroborate our spectroscopy results in identifying the energetically favorable complexes, and predicting WSe<sub>2</sub>:NO at the Se vacancy sites as the predominant dopant species. A maximum hole concentration of ∼10<sup>19</sup> cm<sup>–3</sup> is obtained from XPS and electrical measurements, which is found to be independent of WSe<sub>2</sub> thickness. This degenerate doping level facilitates 5 orders of magnitude reduction in contact resistance between Pd, a common p-type contact metal, and WSe<sub>2</sub>. More generally, the work presents a platform for manipulating the electrical properties and band structure of TMDCs using covalent functionalization