Ligandstabilisierte Metall- und Halbleitercluster als Bausteine in Quantengeraeten. Teilprojekt: Praeparation und Charakterisierung von ein- und zweidimensionalen Metall- und Halbleiterclusterschichten Abschlussbericht

Metallic nanometer clusters composed of 55 gold atoms isolated form each other by thin organic ligand films, with a total size of 2.1-4.2 nm in diameter, were fabricated as monolayers on various technically relevant substrates by using a two-step self-assembly (SA) and Langmuir-Blodgett (LB) techniques. Scanning tunneling microscopy (STM) and scanning force microscopy (SFM) studies on these systems reveal a short range closed packing of these clusters. For clusters weakly bounded on the substrate, a home made active feedback circuit was used to operate dynamic SFM in effective attractive regime. The damage of the sample was effectively prevented and cluster resolution was achieved with this operation mode. Single electron transfer phenomena, including Coulomb blockade and Coulomb staircase were studied by scanning tunneling spectroscopy (STS) at room temperature as well as at low temperature (90-100 K). A narrow spread of the charge energy is observed on such prepared cluster monolayers. (orig.)Available from TIB Hannover: DtF QN1(74,53) / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekSIGLEBundesministerium fuer Bildung, Wissenschaft, Forschung und Technologie, Bonn (Germany)DEGerman

Rastersondentechniken - Einsatz magnetischer Rastersondentechniken in der praeventiven Qualitaetsicherung. Teilprojekt: Magneto-Optisches Nahfeldmikroskop Abschlussbericht

It is suggested to use the tetrahedral tip as a probe for magneto-optic near field microscopy in order to characterise by near-field optical means the local distribution of metals in magnetic storage media and to measure the local distribution of the magnetic field in magnetic write heads. Advantages of the tetrahedral tip as compared to other optical near field probes are expected from its high resolving power, the selective contrast for different materials and the favorable polarisation properties. The main result consists of the realisation of a force distance control of the tetrahedral tip on the basis of quartz tuning forks and its implementation in a combined SNOM/AFM mode. Although no magneto-optical applications could be demonstrated the force distance control is considered as an important prerequisite for this aim. (orig.)SIGLEAvailable from TIB Hannover: DtF QN1(79,35) / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekBundesministerium fuer Bildung und Forschung (BMBF), Bonn (Germany)DEGerman

Hochsensitive markierungsfreie DNA-Mikrochip-Analytik. Teilvorhaben: TOF-SIMS Diagnostik von DNA auf Biosensor-Chips Abschlussbericht

SIGLEAvailable from TIB Hannover: F03B1137 / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekBundesministerium fuer Bildung und Forschung, Berlin (Germany)DEGerman

Untersuchung optisch parametrischer Verstaerker von Pikosekundenpulsen im mittleren Infrarot

SIGLEAvailable from TIB Hannover: F01B1404 / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekBundesministerium fuer Bildung und Forschung, Berlin (Germany)DEGerman

Charakterisierung der Oberflaecheneigenschaften modifizierter Polymere -Benetzung und Lackhaftung bei Polypropylen Abschlussbericht

SIGLEAvailable from TIB Hannover: DtF QN1(89,27) / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekBundesministerium fuer Bildung, Wissenschaft, Forschung und Technologie, Bonn (Germany)DEGerman

TOF-SIMS, Entwicklung eines hochempfindlichen Flugzeit-Sekundaerionen-Massenspektrometers fuer die routinemaessige Spurenanalyse organischer Substanzen Schlussbericht

8 figs.TIB Hannover: D.Dt.F. AC 1000(35,14) / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekSIGLEDEGerman

Qualifizierung von Verfahren zur physikalischen und chemischen Charakterisierung unbehandelter, oberflaechenmodifizierter und metallbeschichteter Polymere zur Qualitaetssicherung. Teilvorhaben: Chemische Charakterisierung Abschlussbericht

The adhesion strength of polymer-metal compound materials, which are produced by metal deposition onto plasma modified substrates, is mainly influenced by the properties of the modified polymer surface. The present research project is intended to help the industry solve problems arising during various steps of the production process. For this purpose, the correlations between chemical and physical substrate properties and the adhesion strength of the compound material for the systems copper/polyimide and aluminum/polycarbonate were investigated. The project 'Chemical characterization' deals with XPS/TOF-SIMS investigations of reference materials and with the qualification of the TOF-SIMS method. For both reference materials, the best adhesion is achieved after mild plasma treatment of the substrate, and the plasma-induced generation of new functionalities at the substrate surface is mainly responsible for adhesion. For the system copper/polyimide, the results lead, for the first time, to a detailed understanding of the adhesion process on a molecular level. The qualification of the TOF-SIMS method is essentially based on a computerized procedure for the evaluation and interpretation of secondary ion mass spectra. It comprises an effective and unified method for data reduction and a TOF-SIMS database with search and comparison algorithms specifically tailored to high-resolution TOF-SIMS. In this way, the routine identification of individual substances from mixtures or blends becomes possible, particularly in the field of polymer research. (orig.)SIGLEAvailable from TIB Hannover: F99B40+a / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekBundesministerium fuer Bildung, Wissenschaft, Forschung und Technologie, Bonn (Germany)DEGerman

Qualifizierung von Verfahren zur physikalischen und chemischen Charakterisierung unbehandelter, oberflaechenmodifizierter und metallbeschichteter Polymere zur Qualitaetssicherung. Teilvorhaben: Chemische Charakterisierung Abschlussbericht

The adhesion strength of polymer-metal compound materials, which are produced by metal deposition onto plasma modified substrates, is mainly influenced by the properties of the modified polymer surface. The present research project is intended to help the industry solve problems arising during various steps of the production process. For this purpose, the correlations between chemical and physical substrate properties and the adhesion strength of the compound material for the systems copper/polyimide and aluminum/polycarbonate were investigated. The project 'Chemical characterization' deals with XPS/TOF-SIMS investigations of reference materials and with the qualification of the TOF-SIMS method. For both reference materials, the best adhesion is achieved after mild plasma treatment of the substrate, and the plasma-induced generation of new functionalities at the substrate surface is mainly responsible for adhesion. For the system copper/polyimide, the results lead, for the first time, to a detailed understanding of the adhesion process on a molecular level. The qualification of the TOF-SIMS method is essentially based on a computerized procedure for the evaluation and interpretation of secondary ion mass spectra. It comprises an effective and unified method for data reduction and a TOF-SIMS database with search and comparison algorithms specifically tailored to high-resolution TOF-SIMS. In this way, the routine identification of individual substances from mixtures or blends becomes possible, particularly in the field of polymer research. (orig.)SIGLEAvailable from TIB Hannover: F99B40+a / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekBundesministerium fuer Bildung, Wissenschaft, Forschung und Technologie, Bonn (Germany)DEGerman

Physikalische und chemische Untersuchungen an realen Katalysatoroberflaechen

TIB: AC 7202 / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekSIGLEDEGerman

Sekundaerionen-Massenspektrometrie zur chemischen Produktanalyse der Eisen- und Stahlindustrie, Entwicklung eines Verfahrens und Geraets Schlussbericht. Berichtszeitraum: 1.10.1980-31.12.1985

TIB: FR 113 / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekSIGLEDEGerman