4 research outputs found
Electrodeposition of Epitaxial Lead Iodide and Conversion to Textured Methylammonium Lead Iodide Perovskite
Applications for lead iodide, such
as lasing, luminescence, radiation detection, and as a precursor for
methylammonium lead iodide perovskite photovoltaic cells, require
highly ordered crystalline thin films. Here, an electrochemical synthesis
route is introduced that yields textured and epitaxial films of lead
iodide at room temperature by reducing molecular iodine to iodide
ions in the presence of lead ions. Lead iodide grows with a [0001]
fiber texture on polycrystalline substrates such as fluorine-doped
tin oxide. On single-crystal Au(100), Au(111), and Au(110) the out-of-plane
orientation of lead iodide is also [0001], but the in-plane orientation
is controlled by the single-crystal substrate. The epitaxial lead
iodide on single-crystal gold is converted to textured methylammonium
lead iodide perovskite with a preferred [110] orientation via methylammonium
iodide vapor-assisted chemical transformation of the solid
Epitaxial Electrodeposition of Methylammonium Lead Iodide Perovskites
An
electrochemical/chemical route is introduced to deposit both
textured and epitaxial films of methylammonium lead iodide (MAPbI<sub>3</sub>) perovskites. The perovskite films are produced by chemical
conversion of lead dioxide films that have been electrodeposited as
either textured or epitaxial films onto [111]-textured Au and [100]
and [111] single-crystal Au substrates. The epitaxial relationships
for the MAPbI<sub>3</sub> films are MAPbI<sub>3</sub>(001)Â[010]∥PbO<sub>2</sub>(100)⟨001⟩ and MAPbI<sub>3</sub>(110)Â[111]∥PbO<sub>2</sub>(100)⟨001⟩ regardless of the Au substrate orientation,
because the in-plane order of the converted film is controlled by
the epitaxial PbO<sub>2</sub> precursor film. The textured and epitaxial
MAPbI<sub>3</sub> films both have trap densities lower than and photoluminescence
intensities higher than those of polycrystalline films produced by
spin coating
Preparation of Bi-Based Ternary Oxide Photoanodes BiVO<sub>4</sub>, Bi<sub>2</sub>WO<sub>6</sub>, and Bi<sub>2</sub>Mo<sub>3</sub>O<sub>12</sub> Using Dendritic Bi Metal Electrodes
The major limitation to investigating
a variety of ternary oxides
for use in solar energy conversion is the lack of synthesis methods
to prepare them as high-quality electrodes. In this study, we demonstrate
that Bi-based n-type ternary oxides, BiVO<sub>4</sub>, Bi<sub>2</sub>WO<sub>6</sub>, and Bi<sub>2</sub>Mo<sub>3</sub>O<sub>12</sub>, can
be prepared as high-quality polycrystalline electrodes by mild chemical
and thermal treatments of electrodeposited dendritic Bi films. The
resulting oxide films have good coverage, adhesion, and electrical
continuity, allowing for facile and accurate evaluation of these compounds
for use in solar water oxidation. In particular, the BiVO<sub>4</sub> electrode retained the porosity and nanocrystallinity of the original
dendritic Bi film. This feature increased the electron–hole
separation yield, making this compound more favorable for use as a
photoanode in a photoelectrochemical cell
Nanometer-Thick Gold on Silicon as a Proxy for Single-Crystal Gold for the Electrodeposition of Epitaxial Cuprous Oxide Thin Films
Single-crystal Au is an excellent
substrate for electrochemical epitaxial growth due to its chemical
inertness, but the high cost of bulk Au single crystals prohibits
their use in practical applications. Here, we show that ultrathin
epitaxial films of Au electrodeposited onto Si(111), Si(100), and
Si(110) wafers can serve as an inexpensive proxy for bulk single-crystal
Au for the deposition of epitaxial films of cuprous oxide (Cu<sub>2</sub>O). The Au films range in thickness from 7.7 nm for a film
deposited for 5 min to 28.3 nm for a film deposited for 30 min. The
film thicknesses are measured by low-angle X-ray reflectivity and
X-ray Laue oscillations. High-resolution TEM shows that there is not
an interfacial SiO<sub><i>x</i></sub> layer between the
Si and Au. The Au films deposited on the Si(111) substrates are smoother
and have lower mosaic spread than those deposited onto Si(100) and
Si(110). The mosaic spread of the Au(111) layer on Si(111) is only
0.15° for a 28.3 nm thick film. Au films deposited onto degenerate
Si(111) exhibit ohmic behavior, whereas Au films deposited onto n-type
Si(111) with a resistivity of 1.15 Ω·cm are rectifying
with a barrier height of 0.85 eV. The Au and the Cu<sub>2</sub>O follow
the out-of-plane and in-plane orientations of the Si substrates, as
determined by X-ray pole figures. The Au and Cu<sub>2</sub>O films
deposited on Si(100) and Si(110) are both twinned. The films grown
on Si(100) have twins with a [221] orientation, and the films grown
on Si(110) have twins with a [411] orientation. An interface model
is proposed for all Si orientations, in which the −24.9% mismatch
for the Au/Si system is reduced to only +0.13% by a coincident site
lattice in which 4 unit meshes of Au coincide with 3 unit meshes of
Si. Although this study only considers the deposition of epitaxial
Cu<sub>2</sub>O films on electrodeposited Au/Si, the thin Au films
should serve as high-quality substrates for the deposition of a wide
variety of epitaxial materials