An analog checker with inputrelative tolerance for duplicate signals

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Analog neural network design for RF built-in self-test

ISBN 978-1-4244-7206-2International audienceA stand-alone built-in self-test architecture mainly consists of three components: a stimulus generator, measurement acquisition sensors, and a measurement processing mechanism to draw out a straightforward Go/No-Go test decision. In this paper, we discuss the design of a neural network circuit to perform the measurement processing step. In essence, the neural network implements a non-linear classifier which can be trained to map directly sensor-based measurements to the Go/No-Go test decision. The neural network is fabricated as a single chip and is put to the test to recognize faulty from functional RF LNA instances. Its decision is based on the readings of two amplitude detectors that are connected to the input and output ports of the RF LNA. We discuss the learning strategy and the generation of information-rich training sets. It is shown that the hardware neural network has comparable learning capabilities with its software counterpart

Advances in variation-aware modeling, verification, and testing of analog ICs

ISBN 978-1-4577-2145-8International audienceThis tutorial paper describes novel scalable, nonlinear/generic, and industrially-oriented approaches to perform variation-aware modeling, verification, fault simulation, and testing of analog/custom ICs. In the first section, Dimitri De Jonghe, Elie Maricau, and Georges Gielen present a new advance in extracting highly nonlinear, variation-aware behavioral models, through the use of data mining and a re-framing of the model-order reduction problem. In the next section, Trent McConaghy describes new statistical machine learning techniques that enable new classes of industrial EDA tools, which in turn are enabling designers to perform fast and accurate PVT / statistical / high-sigma design and verification. In the third section, Bratislav Tasić presents a novel industrially-oriented approach to analog fault simulation that also has applicability to variation-aware design. In the final section, Haralampos Stratigopoulos describes describes state-of-the-art analog testing approaches that address process variability

Review of temperature sensors as monitors for RF mmW built-in testing and self-calibration schemes

International audienceThis paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. The strategy is to embed small temperature sensors on the same silicon die as the circuit under test, taking advantage of empty spaces in the layout. This paper reviews the physical principles, and presents examples that reveal how temperature sensors can be used as functional built-in testers serving to reduce testing costs and enhance yield as part of self-healing strategies