5 research outputs found
Depletion Mode MOSFET Using La-Doped BaSnO<sub>3</sub> as a Channel Material
The
high room-temperature mobility that can be achieved in BaSnO<sub>3</sub> has created significant excitement for its use as channel material
in all-perovskite-based transistor devices such as ferroelectric field
effect transistor (FET). Here, we report on the first demonstration
of <i>n</i>-type depletion-mode FET using hybrid molecular
beam epitaxy grown La-doped BaSnO<sub>3</sub> as a channel material.
The devices utilize a heterostructure metal-oxide semiconductor FET
(MOSFET) design that includes an epitaxial SrTiO<sub>3</sub> barrier
layer capped with a thin layer of HfO<sub>2</sub> used as a gate dielectric.
A field-effect mobility of ∼70 cm<sup>2</sup> V<sup>–1</sup> s<sup>–1</sup>, a record high transconductance value of >2mS/mm
at room temperature, and the on/off ratio exceeding 10<sup>7</sup> at 77 K were obtained. Using temperature- and frequency-dependent
transport measurements, we quantify the impact of the conduction band
offset at the BaSnO<sub>3</sub>/SrTiO<sub>3</sub> interface as well
as bulk and interface traps on device characteristics
Observation of Electrically-Inactive Interstitials in Nb-Doped SrTiO<sub>3</sub>
Despite rapid recent progress, controlled dopant incorporation and attainment of high mobility in thin films of the prototypical complex oxide semiconductor SrTiO<sub>3</sub> remain problematic. Here, analytical scanning transmission electron microscopy is used to study the local atomic and electronic structure of Nb-doped SrTiO<sub>3</sub> both in ideally substitutionally doped bulk single crystals and epitaxial thin films. The films are deposited under conditions that would yield highly stoichiometric <i>undoped</i> SrTiO<sub>3</sub>, but are nevertheless insulating. The Nb incorporation in such films was found to be highly inhomogeneous on nanoscopic length-scales, with large quantities of what we deduce to be interstitial Nb. Electron energy loss spectroscopy reveals changes in the electronic density of states in Nb-doped SrTiO<sub>3</sub> films compared to undoped SrTiO<sub>3</sub>, but without the clear shift in the Fermi edge seen in bulk single crystal Nb-doped SrTiO<sub>3</sub>. Analysis of atomic-resolution annular dark-field images allows us to conclude that the interstitial Nb is in the Nb<sup>0</sup> state, confirming that it is electrically inactive. We argue that this approach should enable future work establishing the vitally needed relationships between synthesis/processing conditions and electronic properties of Nb-doped SrTiO<sub>3</sub> thin films
Roles of Point Defects in Thermal Transport in Perovskite Barium Stannate
Perovskite barium
stannate (BaSnO<sub>3</sub>) is a promising
candidate that can be used as transparent conducting oxide in optoelectronic
devices and as the channel material in high-mobility oxide electronics.
In this work, we calculate the lattice thermal conductivity and investigate
the impact of point defects on thermal transport in BaSnO<sub>3</sub> based on the phonon Boltzmann transport equations with interatomic
force constants from first-principles calculations. In pristine BaSnO<sub>3</sub>, we find the contribution of acoustic phonons to thermal
transport accounts for 54% at 300 K and the rest is attributed to
the lower-frequency (27.5–50 THz) optical modes with relatively
high group velocity. We show oxygen vacancies and impurities can cause
noticeable reduction in thermal conductivity of BaSnO<sub>3</sub>,
but the corresponding mechanisms differ in terms of scattering rates
on different phonon modes. The thermal conductivity reduction due
to oxygen vacancies at 300 K is mainly caused by the increased scattering
of the acoustic phonons and the low-frequency optical phonons. Lanthanum
and potassium impurities mainly increase the scattering of acoustic
phonons, but antimony impurity lowers the thermal conductivity by
increasing the scattering rate of dominant phonons, including both
the acoustic modes and the low-frequency optical modes. The results
and findings facilitate us to better understand the thermal transport
mechanisms of perovskite oxides with an emphasis on the impact of
oxygen vacancies and impurities on the thermal properties of BaSnO<sub>3</sub>
A New Line Defect in NdTiO<sub>3</sub> Perovskite
Perovskite oxides
form an eclectic
class of materials owing to their structural flexibility in accommodating
cations of different sizes and valences. They host well-known point
and planar defects, but so far no line defect has been identified
other than dislocations. Using analytical scanning transmission electron
microscopy (STEM) and ab initio calculations, we have detected and
characterized the atomic and electronic structures of a novel line
defect in NdTiO<sub>3</sub> perovskite. It appears in STEM images
as a perovskite cell rotated by 45°. It consists of self-organized
Ti–O vacancy lines replaced by Nd columns surrounding a central
Ti–O octahedral chain containing Ti<sup>4+</sup> ions, as opposed
to Ti<sup>3+</sup> in the host. The distinct Ti valence in this line
defect introduces the possibility of engineering exotic conducting
properties in a single preferred direction and tailoring novel desirable
functionalities in this Mott insulator
A New Line Defect in NdTiO<sub>3</sub> Perovskite
Perovskite oxides
form an eclectic
class of materials owing to their structural flexibility in accommodating
cations of different sizes and valences. They host well-known point
and planar defects, but so far no line defect has been identified
other than dislocations. Using analytical scanning transmission electron
microscopy (STEM) and ab initio calculations, we have detected and
characterized the atomic and electronic structures of a novel line
defect in NdTiO<sub>3</sub> perovskite. It appears in STEM images
as a perovskite cell rotated by 45°. It consists of self-organized
Ti–O vacancy lines replaced by Nd columns surrounding a central
Ti–O octahedral chain containing Ti<sup>4+</sup> ions, as opposed
to Ti<sup>3+</sup> in the host. The distinct Ti valence in this line
defect introduces the possibility of engineering exotic conducting
properties in a single preferred direction and tailoring novel desirable
functionalities in this Mott insulator