Approximation of full-boundary data from partial-boundary electrode measurements

Measurements on a subset of the boundary are common in electrical impedance tomography, especially any electrode model can be interpreted as a partial boundary problem. The information obtained is different to full-boundary measurements as modeled by the ideal continuum model. In this study we discuss an approach to approximate full-boundary data from partial-boundary measurements that is based on the knowledge of the involved projections. The approximate full-boundary data can then be obtained as the solution of a suitable optimization problem on the coefficients of the Neumann-to-Dirichlet map. By this procedure we are able to improve the reconstruction quality of continuum model based algorithms, in particular we present the effectiveness with a D-bar method. Reconstructions are presented for noisy simulated and real measurement data

Networks for Nonlinear Diffusion Problems in Imaging

A multitude of imaging and vision tasks have seen recently a major transformation by deep learning methods and in particular by the application of convolutional neural networks. These methods achieve impressive results, even for applications where it is not apparent that convolutions are suited to capture the underlying physics. In this work we develop a network architecture based on nonlinear diffusion processes, named DiffNet. By design, we obtain a nonlinear network architecture that is well suited for diffusion related problems in imaging. Furthermore, the performed updates are explicit, by which we obtain better interpretability and generalisability compared to classical convolutional neural network architectures. The performance of DiffNet tested on the inverse problem of nonlinear diffusion with the Perona-Malik filter on the STL-10 image dataset. We obtain competitive results to the established U-Net architecture, with a fraction of parameters and necessary training data

Deep D-Bar: Real-Time Electrical Impedance Tomography Imaging With Deep Neural Networks

The mathematical problem for electrical impedance tomography (EIT) is a highly nonlinear ill-posed inverse problem requiring carefully designed reconstruction procedures to ensure reliable image generation. D-bar methods are based on a rigorous mathematical analysis and provide robust direct reconstructions by using a low-pass filtering of the associated nonlinear Fourier data. Similarly to low-pass filtering of linear Fourier data, only using low frequencies in the image recovery process results in blurred images lacking sharp features, such as clear organ boundaries. Convolutional neural networks provide a powerful framework for post-processing such convolved direct reconstructions. In this paper, we demonstrate that these CNN techniques lead to sharp and reliable reconstructions even for the highly nonlinear inverse problem of EIT. The network is trained on data sets of simulated examples and then applied to experimental data without the need to perform an additional transfer training. Results for absolute EIT images are presented using experimental EIT data from the ACT4 and KIT4 EIT systems

A Data-Driven Edge-Preserving D-bar Method for Electrical Impedance Tomography

In Electrical Impedance Tomography (EIT), the internal conductivity of a body is recovered via current and voltage measurements taken at its surface. The reconstruction task is a highly ill-posed nonlinear inverse problem, which is very sensitive to noise, and requires the use of regularized solution methods, of which D-bar is the only proven method. The resulting EIT images have low spatial resolution due to smoothing caused by low-pass filtered regularization. In many applications, such as medical imaging, it is known \emph{a priori} that the target contains sharp features such as organ boundaries, as well as approximate ranges for realistic conductivity values. In this paper, we use this information in a new edge-preserving EIT algorithm, based on the original D-bar method coupled with a deblurring flow stopped at a minimal data discrepancy. The method makes heavy use of a novel data fidelity term based on the so-called {\em CGO sinogram}. This nonlinear data step provides superior robustness over traditional EIT data formats such as current-to-voltage matrices or Dirichlet-to-Neumann operators, for commonly used current patterns.Comment: 24 pages, 11 figure