45 research outputs found

    Optical and Tribological Properties of PVD/CVD Diamond-like Carbon Films

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    The optical and tribological properties of diamond-like carbon (DLC) films deposited by the combination of magnetron sputtering of graphite and plasmochemical dissociation of methane were studied. It was established that at methane concentration in the gas mixture Ar/CH4 at about 5–10 % the formation of DLC films with refraction index n 2.0, microhardness larger than 1000 HK and friction coefficient of 0.06–0.08 becomes possible

    Optical and Tribological Properties of PVD/CVD Diamond-like Carbon Films

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    The optical and tribological properties of diamond-like carbon (DLC) films deposited by the combination of magnetron sputtering of graphite and plasmochemical dissociation of methane were studied. It was established that at methane concentration in the gas mixture Ar/CH4 at about 5–10 % the formation of DLC films with refraction index n 2.0, microhardness larger than 1000 HK and friction coefficient of 0.06–0.08 becomes possible

    Influence of the annealing temperature on the ferroelectric properties of niobium-doped strontium–bismuth tantalate

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    Characteristics of ferroelectric thin films of nio-bium-doped strontium–bismuth tantalite (SBTN), which were deposited by magnetron sputtering on Pt/TiO2/SiO2/Si substrates, are investigated. To form the ferroelectric structure, deposited films were subjected to subsequent annealing at 700–800Β°C in an O2 atmosphere. The results of X-ray diffraction showed that the films immediately after the deposition have an amorphous structure. Annealing at 700–800Β°C results in the formation of the Aurivillius struc-ture. The dependences of permittivity, residual polariza-tion, and the coercitivity of SBTN films on the modes of subsequent annealing are established. Films with residual polarization 2Pr = 9.2 ΞΌC/cm2, coercitivity 2Ec = 157 kV/cm, and leakage current 10–6 A/cm2 are obtained at the annealing temperature of 800Β°C. The dielectric constant and loss tangent at fre-quency of 1.0 MHz were Ξ΅ = 152 and tanΞ΄ = 0.06. The ferroelectric characteristics allow us to use the SBTN films in the capacitor cell of high density ferroelectric random-access non-volatile memory (FeRAM)

    Effect of Li+ doping on photoelectric properties of double perovskite Cs2SnI6: first principles calculation and experimental investigation

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    Double perovskite Cs2SnI6 and its doping products (with SnI2, SnF2 or organic lithium salts added) have been utilized as p-type hole transport materials for perovskite and dye-sensitized solar cells in many pieces of research, where the mechanism for producing p-type Cs2SnI6 is rarely reported. In this paper, the mechanism of forming p-type Li+ doped Cs2SnI6 was revealed by first-principles simulation. The simulation results show that Li+ entered the Cs2SnI6 lattice by interstitial doping to form strong interaction between Li+ and Iβˆ’, resulting in the splitting of the Ξ± spin-orbital of I–p at the top of the valence band, with the intermediate energy levels created and the absorption edge redshifted. The experimental results confirmed that Li+ doping neither changed the crystal phase of Cs2SnI6, nor introduced impurities. The Hall effect test results of Li+ doped Cs2SnI6 thin film samples showed that Li+ doping transformed Cs2SnI6 into a p-type semiconductor, and substantially promoted its carrier mobility (356.6 cm2/Vs), making it an ideal hole transport material

    Shape tailored Cu2ZnSnS4 nanosheet aggregates for high efficiency solar desalination

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    In this paper, the shape tailored high-purity kesterite phase Cu2ZnSnS4 (CZTS) nanosheet aggregates (NSAs) were prepared in a low cost one-pot solvothermal method, and further fabricated into a salt-blocking membrane for solar desalination. The designed CZTS NSAs membrane-based solar steam generation device featured high solar absorptivity, low thermal energy loss and long-term stability, achieving a remarkable water evaporation rate of 1.54 kg/m2h and solar steam conversion efficiency of 78.85%. It is noteworthy that the quality of artificial seawater desalinated by evaporation was better than that of distilled water, and organic dyes, in particular, could be degraded by nearly 100%. It indicates that the CZTS NSAs membrane is likely to be one of the greatest potential substitutes for seawater desalination as well as repurification of urban reclaimed water and chemical wastewater

    Electron beam nitriding of titanium in medium vacuum

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    We describe a novel method for electron-beam nitriding of metal (titanium) under medium (fore-vacuum) pressures (2–8 Pa) of nitrogen. Titanium sample was heated by a dc electron beam generated by a fore-vacuum plasma-cathode electron source with current up to 100 mA and energy up to 8 kV; this beam also generated beam-produced plasma with active nitrogen atoms, ions and other reactive species near the sample. SEM chemical composition analysis of the nitride layer have shown the presence of approximately 25 wt% of N, wt. 68% of Ti and only wt. 6% of O atoms within the processed layer. The X-ray diffraction spectrum of the nitride sample showed that the modified layer has a crystalline structure predominantly orientated along the crystallographic directions (111), (200), (220), characteristic of Ξ΄-TiN with a face-centered lattice. Besides the Ξ΄-TiN phase, there are present in the nitrided layer a Ξ³ phase of Ti2N (tetragonal nitride) with predominant orientation (200). These results show the advantage of using forevacuum sources for electron beam and plasma nitriding of metals

    ЭлСктрофизичСскиС свойства ΠΏΠ»Π΅Π½ΠΎΠΊ оксида ванадия, нанСсСнных ΠΌΠ΅Ρ‚ΠΎΠ΄ΠΎΠΌ Ρ€Π΅Π°ΠΊΡ‚ΠΈΠ²Π½ΠΎΠ³ΠΎ ΠΌΠ°Π³Π½Π΅Ρ‚Ρ€ΠΎΠ½Π½ΠΎΠ³ΠΎ распылСния

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    The aim of this work was to study the effect of the gas composition during sputtering on the electrophysical properties of vanadium oxide films deposited by pulsed reactive magnetron sputtering of a vanadium target in an Ar/O2 medium of working gases.The dependences of the magnetron discharge voltage, deposition rate, resistivity, temperature coefficient of resistance (TCR), and the band gap of vanadium oxide films on the oxygen concentration in the gas mixture are obtained. It was found that amorphous films of vanadium oxide are formed during reactive magnetron sputtering. It is shown that the properties of the deposited vanadium oxide films have a strong dependence on the oxygen concentration in the Ar/O2 gas mixture, which is associated with the formation of a mixture of various intermediate vanadium oxides in the film. It was found that from the point of view of using vanadium oxide films as thermosensitive layers of microbolometers, the films must be deposited at oxygen concentrations in the gas mixture of 17 to 25 %. At the given oxygen concentrations without heating the substrates, vanadium oxide films with a resistivity (0.6–4.0)Β·10-2 OhmΒ·m, TCR 2.2–2.3%/Β°C and a band gap for direct transitions of 3.7–3.78 eV. The obtained characteristics make it possible to use these films as thermosensitive layers of microbolometers.ЦСлью Ρ€Π°Π±ΠΎΡ‚Ρ‹ являлось исслСдованиС влияния состава Π³Π°Π·ΠΎΠ²ΠΎΠΉ срСды Π² процСссС распылСния Π½Π° элСктрофизичСскиС характСристики ΠΏΠ»Π΅Π½ΠΎΠΊ оксида ванадия, нанСсСнных ΠΌΠ΅Ρ‚ΠΎΠ΄ΠΎΠΌ ΠΈΠΌΠΏΡƒΠ»ΡŒΡΠ½ΠΎΠ³ΠΎ Ρ€Π΅Π°ΠΊΡ‚ΠΈΠ²Π½ΠΎΠ³ΠΎ ΠΌΠ°Π³Π½Π΅Ρ‚Ρ€ΠΎΠ½Π½ΠΎΠ³ΠΎ распылСния Π²Π°Π½Π°Π΄ΠΈΠ΅Π²ΠΎaΠΉ мишСни Π² срСдС Ar/O2 Ρ€Π°Π±ΠΎΡ‡ΠΈΡ… Π³Π°Π·ΠΎΠ².ΠŸΠΎΠ»ΡƒΡ‡Π΅Π½Ρ‹ зависимости напряТСния разряда ΠΌΠ°Π³Π½Π΅Ρ‚Ρ€ΠΎΠ½Π°, скорости нанСсСния, ΡƒΠ΄Π΅Π»ΡŒΠ½ΠΎΠ³ΠΎ сопротивлСния, Ρ‚Π΅ΠΌΠΏΠ΅Ρ€Π°Ρ‚ΡƒΡ€Π½ΠΎΠ³ΠΎ коэффициСнта сопротивлСния (ВКБ), ΡˆΠΈΡ€ΠΈΠ½Ρ‹ оптичСской Π·Π°ΠΏΡ€Π΅Ρ‰Π΅Π½Π½ΠΎΠΉ Π·ΠΎΠ½Ρ‹ ΠΏΠ»Π΅Π½ΠΎΠΊ оксида ванадия ΠΎΡ‚ ΠΊΠΎΠ½Ρ†Π΅Π½Ρ‚Ρ€Π°Ρ†ΠΈΠΈ кислорода Π² смСси Π³Π°Π·ΠΎΠ². УстановлСно, Ρ‡Ρ‚ΠΎ ΠΏΡ€ΠΈ Ρ€Π΅Π°ΠΊΡ‚ΠΈΠ²Π½ΠΎΠΌ ΠΌΠ°Π³Π½Π΅Ρ‚Ρ€ΠΎΠ½ΠΎΠΌ распылСнии Ρ„ΠΎΡ€ΠΌΠΈΡ€ΡƒΡŽΡ‚ΡΡ Π°ΠΌΠΎΡ€Ρ„Π½Ρ‹Π΅ ΠΏΠ»Π΅Π½ΠΊΠΈ оксида ванадия. Показано, Ρ‡Ρ‚ΠΎ элСктрофизичСскиС свойства нанСсСнных ΠΏΠ»Π΅Π½ΠΎΠΊ оксида ванадия ΠΈΠΌΠ΅ΡŽΡ‚ ΡΠΈΠ»ΡŒΠ½ΡƒΡŽ Π·Π°Π²ΠΈΡΠΈΠΌΠΎΡΡ‚ΡŒ ΠΎΡ‚ ΠΊΠΎΠ½Ρ†Π΅Π½Ρ‚Ρ€Π°Ρ†ΠΈΠΈ кислорода Π² Ar/O2 смСси Π³Π°Π·ΠΎΠ², Ρ‡Ρ‚ΠΎ связано с ΠΎΠ±Ρ€Π°Π·ΠΎΠ²Π°Π½ΠΈΠ΅ΠΌ Π² ΠΏΠ»Π΅Π½ΠΊΠ΅ смСси Ρ€Π°Π·Π»ΠΈΡ‡Π½Ρ‹Ρ… ΠΏΡ€ΠΎΠΌΠ΅ΠΆΡƒΡ‚ΠΎΡ‡Π½Ρ‹Ρ… оксидов ванадия. УстановлСно, Ρ‡Ρ‚ΠΎ с Ρ‚ΠΎΡ‡ΠΊΠΈ зрСния использования ΠΏΠ»Π΅Π½ΠΎΠΊ оксида ванадия Π² качСствС Ρ‚Π΅Ρ€ΠΌΠΎΡ‡ΡƒΠ²ΡΡ‚Π²ΠΈΡ‚Π΅Π»ΡŒΠ½Ρ‹Ρ… слоСв ΠΏΠ»Π΅Π½ΠΊΠΈ Π½Π΅ΠΎΠ±Ρ…ΠΎΠ΄ΠΈΠΌΠΎ Π½Π°Π½ΠΎΡΠΈΡ‚ΡŒ ΠΏΡ€ΠΈ концСнтрациях кислорода Π² смСси Π³Π°Π·ΠΎΠ² ΠΎΡ‚ 17 Π΄ΠΎ 25 %. ΠŸΡ€ΠΈ Π΄Π°Π½Π½Ρ‹Ρ… концСнтрациях кислорода Π±Π΅Π· Π½Π°Π³Ρ€Π΅Π²Π° ΠΏΠΎΠ΄Π»ΠΎΠΆΠ΅ΠΊ ΠΏΠΎΠ»ΡƒΡ‡Π΅Π½Ρ‹ ΠΏΠ»Π΅Π½ΠΊΠΈ оксида ванадия с ΡƒΠ΄Π΅Π»ΡŒΠ½Ρ‹ΠΌ сопротивлСниСм (0,6–4,0)Β·10-2 Ом·м, ВКБ 2,2–2,3 %/Β°C ΠΈ ΡˆΠΈΡ€ΠΈΠ½ΠΎΠΉ Π·Π°ΠΏΡ€Π΅Ρ‰Π΅Π½Π½ΠΎΠΉ Π·ΠΎΠ½Ρ‹ для прямых ΠΏΠ΅Ρ€Π΅Ρ…ΠΎΠ΄ΠΎΠ² 3,7–3,78 эВ. ΠŸΠΎΠ»ΡƒΡ‡Π΅Π½Π½Ρ‹Π΅ характСристики ΠΏΠΎΠ·Π²ΠΎΠ»ΡΡŽΡ‚ ΠΈΡΠΏΠΎΠ»ΡŒΠ·ΠΎΠ²Π°Ρ‚ΡŒ Π΄Π°Π½Π½Ρ‹Π΅ ΠΏΠ»Π΅Π½ΠΊΠΈ Π² качСствС Ρ‚Π΅Ρ€ΠΌΠΎΡ‡ΡƒΠ²ΡΡ‚Π²ΠΈΡ‚Π΅Π»ΡŒΠ½Ρ‹Ρ… слоСв ΠΌΠΈΠΊΡ€ΠΎΠ±ΠΎΠ»ΠΎΠΌΠ΅Ρ‚Ρ€ΠΎΠ²

    МодСль процСсса Ρ€Π΅Π°ΠΊΡ‚ΠΈΠ²Π½ΠΎΠ³ΠΎ ΠΌΠ°Π³Π½Π΅Ρ‚Ρ€ΠΎΠ½Π½ΠΎΠ³ΠΎ распылСния Π΄Π²ΡƒΡ…ΠΊΠΎΠΌΠΏΠΎΠ½Π΅Π½Ρ‚Π½ΠΎΠΉ составной мишСни

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    The article proposes a model for predicting the content of metal components of complex oxide films deposited by reactive magnetron sputtering of a two-component composite target in Ar/O2 gas mixture. The model takes into account the sputtering yield and ion-electron emission coefficients of the sputtered metals and their oxides, the distribution of the ion current density on the target, and the rate of the chemical reaction of the formation of oxides of these metals. To verify the proposed model, studies of the elemental composition of titanium-aluminum oxide films deposited by magnetron sputtering of a Ti-Al composite target in Ar and Ar/O2 gas mixture were carried out. It has been established that the model adequately describes the change in the content of metals in the deposited films with a change in the oxygen flow into the chamber. The simulation error does not exceed 10 %, this makes it possible to use the proposed model for predicting the content of metals in a film during reactive sputtering of two-component composite targets.Π’ ΡΡ‚Π°Ρ‚ΡŒΠ΅ ΠΏΡ€Π΅Π΄Π»ΠΎΠΆΠ΅Π½Π° модСль для прогнозирования содСрТания мСталличСских ΡΠΎΡΡ‚Π°Π²Π»ΡΡŽΡ‰ΠΈΡ… ΠΏΠ»Π΅Π½ΠΎΠΊ слоТных оксидов, наносимых ΠΌΠ΅Ρ‚ΠΎΠ΄ΠΎΠΌ Ρ€Π΅Π°ΠΊΡ‚ΠΈΠ²Π½ΠΎΠ³ΠΎ ΠΌΠ°Π³Π½Π΅Ρ‚Ρ€ΠΎΠ½Π½ΠΎΠ³ΠΎ распылСния Π΄Π²ΡƒΡ…ΠΊΠΎΠΌΠΏΠΎΠ½Π΅Π½Ρ‚Π½ΠΎΠΉ составной мишСни Π² срСдС Ar/O2 Ρ€Π°Π±ΠΎΡ‡ΠΈΡ… Π³Π°Π·ΠΎΠ². Π’ ΠΌΠΎΠ΄Π΅Π»ΠΈ ΡƒΡ‡ΠΈΡ‚Ρ‹Π²Π°Π»ΠΈΡΡŒ коэффициСнты распылСния ΠΈ ΠΈΠΎΠ½Π½ΠΎ-элСктронной эмиссии распыляСмых ΠΌΠ΅Ρ‚Π°Π»Π»ΠΎΠ² ΠΈ ΠΈΡ… оксидов, распрСдСлСниС плотности ΠΈΠΎΠ½Π½ΠΎΠ³ΠΎ Ρ‚ΠΎΠΊΠ° Π½Π° мишСни ΠΈ скорости химичСской Ρ€Π΅Π°ΠΊΡ†ΠΈΠΈ образования оксидов этих ΠΌΠ΅Ρ‚Π°Π»Π»ΠΎΠ². Для Π²Π΅Ρ€ΠΈΡ„ΠΈΠΊΠ°Ρ†ΠΈΠΈ ΠΏΡ€Π΅Π΄Π»ΠΎΠΆΠ΅Π½Π½ΠΎΠΉ ΠΌΠΎΠ΄Π΅Π»ΠΈ ΠΏΡ€ΠΎΠ²Π΅Π΄Π΅Π½Ρ‹ исслСдования элСмСнтного состава ΠΏΠ»Π΅Π½ΠΎΠΊ оксида Ρ‚ΠΈΡ‚Π°Π½Π°-алюминия, нанСсСнных ΠΌΠ°Π³Π½Π΅Ρ‚Ρ€ΠΎΠ½Π½Ρ‹ΠΌ распылСниСм Ti-Al составной мишСни Π² срСдС Ar ΠΈ Ar/O2 Ρ€Π°Π±ΠΎΡ‡ΠΈΡ… Π³Π°Π·ΠΎΠ². УстановлСно, Ρ‡Ρ‚ΠΎ модСль Π°Π΄Π΅ΠΊΠ²Π°Ρ‚Π½ΠΎ описываСт ΠΈΠ·ΠΌΠ΅Π½Π΅Π½ΠΈΠ΅ содСрТания ΠΌΠ΅Ρ‚Π°Π»Π»ΠΎΠ² Π² нанСсСнных ΠΏΠ»Π΅Π½ΠΊΠ°Ρ… ΠΏΡ€ΠΈ ΠΈΠ·ΠΌΠ΅Π½Π΅Π½ΠΈΠΈ ΠΏΠΎΡ‚ΠΎΠΊΠ° кислорода Π² ΠΊΠ°ΠΌΠ΅Ρ€Ρƒ. ΠŸΠΎΠ³Ρ€Π΅ΡˆΠ½ΠΎΡΡ‚ΡŒ модСлирования – Π½Π΅ Π±ΠΎΠ»Π΅Π΅ 10 %, Ρ‡Ρ‚ΠΎ позволяСт ΠΏΡ€ΠΈΠΌΠ΅Π½ΡΡ‚ΡŒ модСль для прогнозирования содСрТания ΠΌΠ΅Ρ‚Π°Π»Π»ΠΎΠ² Π² ΠΏΠ»Π΅Π½ΠΊΠ΅ ΠΏΡ€ΠΈ Ρ€Π΅Π°ΠΊΡ‚ΠΈΠ²Π½ΠΎΠΌ распылСнии Π΄Π²ΡƒΡ…ΠΊΠΎΠΌΠΏΠΎΠ½Π΅Π½Ρ‚Π½Ρ‹Ρ… составных мишСнСй

    Π€ΠžΠ ΠœΠ˜Π ΠžΠ’ΠΠΠ˜Π• ΠžΠ‘ΠͺΠ•ΠœΠΠ«Π₯ Π’Π«Π’ΠžΠ”ΠžΠ’ ΠŸΠžΠ›Π£ΠŸΠ ΠžΠ’ΠžΠ”ΠΠ˜ΠšΠžΠ’Π«Π₯ ΠŸΠ Π˜Π‘ΠžΠ ΠžΠ’ ΠœΠ•Π’ΠžΠ”ΠžΠœ Π­Π›Π•ΠšΠ’Π ΠžΠ₯Π˜ΠœΠ˜Π§Π•Π‘ΠšΠžΠ“Πž ΠžΠ‘ΠΠ–Π”Π•ΠΠ˜Π―

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    Using nonstationary regimes electrolysis for electrodepositing silver solder bump semiconductor blocked has reduced lateral expansion of different height on the plate, to improve the qualitative characteristics of the product, increase the number of devices produced on a semiconductor wafer, and thereby improve process performance and achieve economies of precious metals.ИсслСдовано влияниС состава элСктролита ΠΈ ΠΏΡ€ΠΎΠ³Ρ€Π°ΠΌΠΌΠΈΡ€ΡƒΠ΅ΠΌΡ‹Ρ… ΠΈΠΌΠΏΡƒΠ»ΡŒΡΠ½ΠΎ-рСвСрсных Ρ€Π΅ΠΆΠΈΠΌΠΎΠ² Π½Π° ΡΠΊΠΎΡ€ΠΎΡΡ‚ΡŒ ΠΈ Ρ€Π°Π²Π½ΠΎΠΌΠ΅Ρ€Π½ΠΎΡΡ‚ΡŒ формирования ΠΎΠ±ΡŠΠ΅ΠΌΠ½Ρ‹Ρ… сСрСбряных Π²Ρ‹Π²ΠΎΠ΄ΠΎΠ² ΠΏΠΎΠ»ΡƒΠΏΡ€ΠΎΠ²ΠΎΠ΄Π½ΠΈΠΊΠΎΠ²Ρ‹Ρ… ΠΏΡ€ΠΈΠ±ΠΎΡ€ΠΎΠ². Показано, Ρ‡Ρ‚ΠΎ использованиС нСстационарных Ρ€Π΅ΠΆΠΈΠΌΠΎΠ² элСктролиза позволяСт ΡΠ½ΠΈΠ·ΠΈΡ‚ΡŒ ΠΈΡ… Π±ΠΎΠΊΠΎΠ²ΠΎΠ΅ разрастаниС ΠΈ Ρ€Π°Π·Π½ΠΎΠ²Ρ‹ΡΠΎΡ‚Π½ΠΎΡΡ‚ΡŒ ΠΏΠΎ пластинС, ΡƒΠ»ΡƒΡ‡ΡˆΠΈΡ‚ΡŒ качСствСнныС характСристики ΠΈΠ·Π΄Π΅Π»ΠΈΠΉ, ΡƒΠ²Π΅Π»ΠΈΡ‡ΠΈΡ‚ΡŒ количСство ΠΏΡ€ΠΈΠ±ΠΎΡ€ΠΎΠ², ΠΏΠΎΠ»ΡƒΡ‡Π°Π΅ΠΌΡ‹Ρ… Π½Π° ΠΎΠ΄Π½ΠΎΠΉ ΠΏΠΎΠ»ΡƒΠΏΡ€ΠΎΠ²ΠΎΠ΄Π½ΠΈΠΊΠΎΠ²ΠΎΠΉ пластинС, ΠΈ, Ρ‚Π΅ΠΌ самым, ΠΏΠΎΠ²Ρ‹ΡΠΈΡ‚ΡŒ ΠΏΡ€ΠΎΠΈΠ·Π²ΠΎΠ΄ΠΈΡ‚Π΅Π»ΡŒΠ½ΠΎΡΡ‚ΡŒ тСхнологичСского процСсса ΠΈ ΠΎΠ±Π΅ΡΠΏΠ΅Ρ‡ΠΈΡ‚ΡŒ экономию Π΄Ρ€Π°Π³ΠΌΠ΅Ρ‚Π°Π»Π»ΠΎΠ²

    Анодная композиционная наноструктура: Ρ„ΠΎΡ€ΠΌΠΈΡ€ΠΎΠ²Π°Π½ΠΈΠ΅, морфология, оптичСскиС ΠΈ Ρ„ΠΎΡ‚ΠΎΠ»ΡŽΠΌΠΈΠ½Π΅ΡΡ†Π΅Π½Ρ‚Π½Ρ‹Π΅ свойства

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    Two-layer Al/Nb (1000/200 nm) was deposited by sputtering using a DC magnetron method on Si wafers. The anodizing was in 0.2 M oxalic solution at 53 V, re-anodized in the 0.5 M boric acid in potentiodynamic mode at increase of potential until 400 V. For forming anodic composite nanostructure, the porous anodic aluminum oxide was partially removed in 50 % aqueous solution of phosphoric acid at 50Β°C for 1200 s. The morphology, photoluminescence, and optical reflection of an anodic composite nanostructure were investigated. The anodic composite nanostructure showed effective optical reflection in the wavelength range from 540 to 1000 nm, and the maximum reflective efficiency was observed at a wavelength of 850 nm, 52 % reflectance occurs. The photoluminescence maximum was observed at a wavelength of 453 nm.Двухслойная систСма Al/Nb (1000/200 Π½ΠΌ) Π½Π° ΠΊΡ€Π΅ΠΌΠ½ΠΈΠ΅Π²ΠΎΠΉ ΠΏΠΎΠ΄Π»ΠΎΠΆΠΊΠ΅ Π±Ρ‹Π»Π° ΠΏΡ€ΠΎΠ°Π½ΠΎΠ΄ΠΈΡ€ΠΎΠ²Π°Π½Π° Π² 0,2 М Π²ΠΎΠ΄Π½ΠΎΠΌ растворС Ρ‰Π°Π²Π΅Π»Π΅Π²ΠΎΠΉ кислоты ΠΏΡ€ΠΈ постоянном напряТСнии 53 Π’. ПослС Π·Π°Π²Π΅Ρ€ΡˆΠ΅Π½ΠΈΡ этапа анодирования алюминия ΠΏΡ€ΠΎΠΈΠ·Π²ΠΎΠ΄ΠΈΠ»ΠΈ Π·Π°ΠΌΠ΅Π½Ρƒ элСктролита Π½Π° 0,5 М Π²ΠΎΠ΄Π½Ρ‹ΠΉ раствор Π±ΠΎΡ€Π½ΠΎΠΉ кислоты ΠΈ Π·Π°Ρ‚Π΅ΠΌ Ρ€Π΅Π°Π½ΠΎΠ΄ΠΈΡ€ΠΎΠ²Π°Π»ΠΈ подслой ниобия Π΄ΠΎ напряТСния 400 Π’. Для создания Π°Π½ΠΎΠ΄Π½ΠΎΠΉ ΠΊΠΎΠΌΠΏΠΎΠ·ΠΈΡ†ΠΈΠΎΠ½Π½ΠΎΠΉ наноструктуры ΠΏΡ€ΠΎΠ²ΠΎΠ΄ΠΈΠ»ΠΈ ΡƒΠ΄Π°Π»Π΅Π½ΠΈΠ΅ большСй части Π°Π½ΠΎΠ΄Π½ΠΎΠ³ΠΎ оксида алюминия ΠΌΠ΅Ρ‚ΠΎΠ΄ΠΎΠΌ химичСского травлСния Π² Ρ‚Π΅Ρ‡Π΅Π½ΠΈΠ΅ 1200 с Π² 50 % растворС ортофосфорной кислоты ΠΏΡ€ΠΈ Ρ‚Π΅ΠΌΠΏΠ΅Ρ€Π°Ρ‚ΡƒΡ€Π΅ 50 Β°Π‘. ИсслСдована морфология, Ρ„ΠΎΡ‚ΠΎΠ»ΡŽΠΌΠΈΠ½Π΅ΡΡ†Π΅Π½Ρ†ΠΈΡ, оптичСскоС ΠΎΡ‚Ρ€Π°ΠΆΠ΅Π½ΠΈΠ΅ Π°Π½ΠΎΠ΄Π½ΠΎΠΉ ΠΊΠΎΠΌΠΏΠΎΠ·ΠΈΡ†ΠΈΠΎΠ½Π½ΠΎΠΉ наноструктуры. Анодная композиционная наноструктура ΠΏΠΎΠΊΠ°Π·Π°Π»Π° эффСктивноС оптичСскоС ΠΎΡ‚Ρ€Π°ΠΆΠ΅Π½ΠΈΠ΅ Π² Π΄ΠΈΠ°ΠΏΠ°Π·ΠΎΠ½Π΅ Π΄Π»ΠΈΠ½ Π²ΠΎΠ»Π½ ΠΎΡ‚ 540 Π΄ΠΎ 1000 Π½ΠΌ, Π° максимальная ΠΎΡ‚Ρ€Π°ΠΆΠ°ΡŽΡ‰Π°Ρ ΡΡ„Ρ„Π΅ΠΊΡ‚ΠΈΠ²Π½ΠΎΡΡ‚ΡŒ наблюдалась Π½Π° Π΄Π»ΠΈΠ½Π΅ Π²ΠΎΠ»Π½Ρ‹ 850 Π½ΠΌ ΠΈ составляСт 52 %. Пик Ρ„ΠΎΡ‚ΠΎΠ»ΡŽΠΌΠΈΠ½Π΅ΡΡ†Π΅Π½Ρ†ΠΈΠΈ наблюдался Π½Π° Π΄Π»ΠΈΠ½Π΅ Π²ΠΎΠ»Π½Ρ‹ 453 Π½ΠΌ.
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