Low specimen drift holder, cooler and heat flow reductor for use in microscopy

The present invention is in the field of a low specimen drift holder and cooler for use in microscopy, and a microscope comprising said holder. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam mi- croscopy (EM and FIB). However it application is extendable in principle to any field of microscopy, especially wherein a specimen is cooled or needs cooling.QN/Quantum NanoscienceApplied Science

Arrangement and method for accommodating a sample in an electron microscope

Abstract of NL 9402226 (A) The invention relates to an arrangement for accommodating a sample in an electron microscope, equipped with a sample holder which comprises sample accommodation means and is designed for at least partial accommodation in an electron microscope, where at least one sample mount is provided which can contain a sample in a position in which the sample is at least partially visible from the outside of the sample mount from at least two sides opposite one another, the or each sample mount being capable of being accommodated in the sample accommodation means. The invention further relates to a method for accommodating a sample in an electron microscope

Beveiligingsysteem tegen diefstal van een laptop computer

Applied Science

Transferrable system for use in in-situ experiments in a microscope

The present invention is in the field of a transferrable system for use in in-situ experiments in a microscope and spectrometer, use of said transferrable system, and a microscope or spectrometer comprising said transferrable system, wherein the microscope is selected from an electron microscope, an IR-microscope, a Raman-microscope, X-ray micro- scope, and an optical microscope, such as a TEM, a SEM, a transmission mode SEM, and combinations thereof.QN/Quantum NanoscienceApplied Science

Specimen holder for an electron microscope, and method for reducing thermal drift in a microscope

A specimen holder for an electron microscope, comprising a rod-shaped part, which is provided near one end with a tip, which tip is arranged to receive a specimen, the rod-shaped part, in use, extending with at least the tip into the electron microscope, held by clamping means present in the electron microscope, wherein first temperature control means are provided to control the temperature of the rod-shaped part and/or the clamping means, such that this rod-shaped part and the clamping means substantially have the same temperature, at least at the location of their contact surfaces.Applied Science

In-situ transmission electron microscopy at pressures above 1 bar and elevated temperatures

Quantum NanoscienceApplied Science

Investigations of Domain Structures in La0.7Ca0.3MnO3 Single Crystals

Quantum NanoscienceApplied Science

Method for sample preparation for cryoelectron microscopy (CEM) microreactor and loading platform

A method for sample preparation for cryoelectron microscopy (CEM), wherein the sample is held in a microreactor, wherein the conditions in the microreactor are regulated relative to the environment, wherein the sample in the microreactor is frozen according to a quench freeze process, whereupon the sample, in frozen condition, is placed in the electron microscope. A microreactor for use with cryoelectron microscopy (CEM), comprising a first and second membrane, which membranes, at least in a condition of use, enclose a chamber, while the membranes are configured to last until at least the beginning of a quench freeze process.Applied Science

Method and apparatus for controlled manufacturing of nanometer-scale apertures

The invention relates to a method for manufacturing nanometer-scale apertures, wherein, in an object, in a conventional manner, at least one aperture is provided with a nanometer-scale surface area, after which, by means of an electron beam, energy is supplied to at least the edge of said at least one aperture, such that the surface area of the respective aperture is adjusted, wherein the surface area of the aperture is controlled during adjustment and the supply of energy is regulated on the basis of the surface area change.Applied Science

Surface decomposition of Pb2Sr2(Ca,Y)Cu3O8+? at room temperature studied with high-resolution electron microscopy

High-resolution electron microscopy shows that Pb2Sr2(Ca,Y)Cu3O8+? is sensitive to air at room temperature. Planar defects are induced by exposure to air. These planar defects are due to a depletion of Pb and Cu from the three-layer block: PbO-Cu?-PbO, ? being a vacancy. Once these blocks are depleted, further depletion is enhanced, leading to almost completely depleted patches within these blocks and finally to the absence of several of the layers within this block. The new structures, thus formed, are potential new superconductors with high Tc’s.Applied Science