Arrangement and method for accommodating a sample in an electron microscope

Abstract

Abstract of NL 9402226 (A) The invention relates to an arrangement for accommodating a sample in an electron microscope, equipped with a sample holder which comprises sample accommodation means and is designed for at least partial accommodation in an electron microscope, where at least one sample mount is provided which can contain a sample in a position in which the sample is at least partially visible from the outside of the sample mount from at least two sides opposite one another, the or each sample mount being capable of being accommodated in the sample accommodation means. The invention further relates to a method for accommodating a sample in an electron microscope