6 research outputs found
Controlled Preferential Oxidation of Grain Boundaries in Monolayer Tungsten Disulfide for Direct Optical Imaging
Synthetic 2D crystal films grown by chemical vapor deposition are typically polycrystalline, and determining grain size within domains and continuous films is crucial for determining their structure. Here we show that grain boundaries in the 2D transition metal dichalcogenide WS<sub>2</sub>, grown by CVD, can be preferentially oxidized by controlled heating in air. Under our developed conditions, preferential degradation at the grain boundaries causes an increase in their physical size due to oxidation. This increase in size enables their clear and rapid identification using a standard optical microscope. We demonstrate that similar treatments in an Ar environment do no show this effect, confirming that oxidation is the main role in the structural change. Statistical analysis of grain boundary (GB) angles shows dominant mirror formation. Electrical biasing across the GB is shown to lead to changes at the GB and their observation under an optical microscope. Our approach enables high-throughput screening of as-synthesized WS<sub>2</sub> domains and continuous films to determine their crystallinity and should enable improvements in future CVD growth of these materials
Electroluminescence Dynamics across Grain Boundary Regions of Monolayer Tungsten Disulfide
We
study how grain boundaries (GB) in chemical vapor deposition (CVD)
grown monolayer WS<sub>2</sub> influence the electroluminescence (EL)
behavior in lateral source-drain devices under bias. Real time imaging
of the WS<sub>2</sub> EL shows arcing between the electrodes when
probing across a GB, which then localizes at the GB region as it erodes
under high bias conditions. In contrast, single crystal WS<sub>2</sub> domains showed no signs of arcing or localized EL. Analysis of the
eroded GB region shows the formation of micro- and nanoribbons across
the monolayer WS<sub>2</sub> domains. Comparison of the EL spectrum
with the photoluminescence spectrum from the monolayer WS<sub>2</sub> shows close agreement, indicating the EL emission comes from direct
band gap excitonic recombination. These results provide important
insights into EL devices that utilize CVD grown monolayer transition
metal dichalcogenides when GBs are present in the active device region
Shape Evolution of Monolayer MoS<sub>2</sub> Crystals Grown by Chemical Vapor Deposition
Atmospheric-pressure
chemical vapor deposition (CVD) is used to
grow monolayer MoS<sub>2</sub> two-dimensional crystals at elevated
temperatures on silicon substrates with a 300 nm oxide layer. Our
CVD reaction is hydrogen free, with the sulfur precursor placed in
a furnace separate from the MoO<sub>3</sub> precursor to individually
control their heating profiles and provide greater flexibility in
the growth recipe. We intentionally establish a sharp gradient of
MoO<sub>3</sub> precursor concentration on the growth substrate to
explore its sensitivity to the resultant MoS<sub>2</sub> domain growth
within a relatively uniform temperature range. We find that the shape
of MoS<sub>2</sub> domains is highly dependent upon the spatial location
on the silicon substrate, with variation from triangular to hexagonal
geometries. The shape change of domains is attributed to local changes
in the Mo:S ratio of precursors (1:>2, 1:2, and 1:<2) and its
influence
on the kinetic growth dynamics of edges. These results improve our
understanding of the factors that influence the growth of MoS<sub>2</sub> domains and their shape evolution
Revealing Defect-State Photoluminescence in Monolayer WS<sub>2</sub> by Cryogenic Laser Processing
Understanding the stability of monolayer
transition metal dichalcogenides
in atmospheric conditions has important consequences for their handling,
life-span, and utilization in applications. We show that cryogenic
photoluminescence spectroscopy (PL) is a highly sensitive technique
to the detection of oxidation induced degradation of monolayer tungsten
disulfide (WS<sub>2</sub>) caused by exposure to ambient conditions.
Although long-term exposure to atmospheric conditions causes massive
degradation from oxidation that is optically visible, short-term exposure
produces no obvious changes to the PL or Raman spectra measured at
either room temperature or even cryogenic environment. Laser processing
was employed to remove the surface adsorbents, which enables the defect
states to be detected via cryogenic PL spectroscopy. Thermal cycling
to room temperature and back down to 77 K shows the process is reversible.
We also monitor the degradation process of WS<sub>2</sub> using this
method, which shows that the defect related peak can be observed after
one month aging in ambient conditions
Biexciton Formation in Bilayer Tungsten Disulfide
Monolayer
transition metal dichalcogenides (TMDs) are direct band
gap semiconductors, and their 2D structure results in large binding
energies for excitons, trions, and biexcitons. The ability to explore
many-body effects in these monolayered structures has made them appealing
for future optoelectronic and photonic applications. The band structure
changes for bilayer TMDs with increased contributions from indirect
transitions, and this has limited similar in-depth studies of biexcitons.
Here, we study biexciton emission in bilayer WS<sub>2</sub> grown
by chemical vapor deposition as a function of temperature. A biexciton
binding energy of 36 ±4 meV is measured in the as-grown bilayer
WS<sub>2</sub> containing 0.4% biaxial strain as determined by Raman
spectroscopy. The biexciton emission was difficult to detect when
the WS<sub>2</sub> was transferred to another substrate to release
the stain. Density functional theory calculations show that 0.4% of
tensile strain lowers the direct band gap by about 55 meV without
significant change to the indirect band gap, which can cause an increase
in the quantum yield of direct exciton transitions and the emission
from biexcitons formed by two direct gap excitons. We find that the
biexciton emission decreases dramatically with increased temperature
due to the thermal dissociation, with an activation energy of 26 ±
5 meV. These results show how strain can be used to tune the many-body
effects in bilayered TMD materials and extend the photonic applications
beyond pure monolayer systems
Doping Graphene Transistors Using Vertical Stacked Monolayer WS<sub>2</sub> Heterostructures Grown by Chemical Vapor Deposition
We study the interactions in graphene/WS<sub>2</sub> two-dimensional (2D) layered vertical heterostructures with
variations in the areal coverage of graphene by the WS<sub>2</sub>. All 2D materials were grown by chemical vapor deposition and transferred
layer by layer. Photoluminescence (PL) spectroscopy of WS<sub>2</sub> on graphene showed PL quenching along with an increase in the ratio
of exciton/trion emission, relative to WS<sub>2</sub> on SiO<sub>2</sub> surface, indicating a reduction in the n-type doping levels of WS<sub>2</sub> as well as reduced radiative recombination quantum yield.
Electrical measurements of a total of 220 graphene field effect transistors
with different WS<sub>2</sub> coverage showed double-Dirac points
in the field effect measurements, where one is shifted closer toward
the 0 V gate neutrality position due to the WS<sub>2</sub> coverage.
Photoirradiation of the WS<sub>2</sub> on graphene region caused further
Dirac point shifts, indicative of a reduction in the p-type doping
levels of graphene, revealing that the photogenerated excitons in
WS<sub>2</sub> are split across the heterostructure by electron transfer
from WS<sub>2</sub> to graphene. Kelvin probe microscopy showed that
regions of graphene covered with WS<sub>2</sub> had a smaller work
function and supports the model of electron transfer from WS<sub>2</sub> to graphene. Our results demonstrate the formation of junctions
within a graphene transistor through the spatial tuning of the work
function of graphene using these 2D vertical heterostructures