1 research outputs found
Low Temperature Nanoscale Oxygen-Ion Intercalation into Epitaxial MoO<sub>2</sub> Thin Films
In
transition metal oxides (TMOs), lots of physical phenomena such
as metal–insulator transitions (MIT), magnetism, and ferroelectricity
are closely related to the amounts of oxygen contents. Thus, understanding
surface oxidation process in TMOs and its effect are important for
enhancing performances of modern electronic and electrochemical devices
due to miniaturization of those devices. In this regard, MoO<sub>2+<i>x</i></sub> (0 ≤ <i>x</i> ≤ 1) is an
interesting TMO, which shows MIT driven by the change of its oxygen
content, i.e. metallic MoO<sub>2</sub> and insulating MoO<sub>3</sub>. Hence, understanding thermally driven oxygen intercalation into
MoO<sub>2</sub> is very important. In this work, we conducted <i>in situ</i> postannealing of as-grown epitaxial MoO<sub>2</sub> thin films at different temperatures in oxidative condition to investigate
the thermal effect on oxygen ion intercalation and resultant MIT in
MoO<sub>2+<i>x</i></sub>. Through the spectroscopic techniques
such as spectroscopic ellipsometry and X-ray absorption spectroscopy,
we observed that oxygen ions can intercalate into MoO<sub>2</sub> and
trigger a phase transition in nanoscale at surprisingly low-temperature
as low as 250 °C. In addition, after oxygen annealing at 350
°C, we find that both hybridization and interband transition
energy between O 2p and Mo 4d t<sub>2g</sub> are significantly shifted
to low energy nearly 0.2 eV, which clearly supports that the electronic
transition of MoO<sub>2+<i>x</i></sub> is predominantly
driven by change of oxygen contents