53,545 research outputs found
Atomic-Layer-Deposited Al2O3 on Bi2Te3 for Topological Insulator Field-Effect Transistors
We report dual-gate modulation of topological insulator field-effect
transistors (TI FETs) made on Bi2Te3 thin flakes with integration of
atomic-layer-deposited (ALD) Al2O3 high-k dielectric. Atomic force microscopy
study shows that ALD Al2O3 is uniformly grown on this layer-structured channel
material. Electrical characterization reveals that the right selection of ALD
precursors and the related surface chemistry play a critical role in device
performance of Bi2Te3 based TI FETs. We realize both top-gate and bottom-gate
control on these devices, and the highest modulation rate of 76.1% is achieved
by using simultaneous dual gate control.Comment: 4 pages, 3 figure
The control of motion during entry into the atmosphere
Algorithm for control of motion during entry into atmospher
MoS2 Dual-Gate MOSFET with Atomic-Layer-Deposited Al2O3 as Top-Gate Dielectric
We demonstrate atomic-layer-deposited (ALD) high-k dielectric integration on
two-dimensional (2D) layer-structured molybdenum disulfide (MoS2) crystals and
MoS2 dual-gate n-channel MOSFETs with ALD Al2O3 as top-gate dielectric. Our C-V
study of MOSFET structures shows good interface between 2D MoS2 crystal and ALD
Al2O3. Maximum drain currents using back-gates and top-gates are measured to be
7.07mA/mm and 6.42mA/mm at Vds=2V with a channel width of 3 {\mu}m, a channel
length of 9 {\mu}m, and a top-gate length of 3 {\mu}m. We achieve the highest
field-effect mobility of electrons using back-gate control to be 517 cm^2/Vs.
The highest current on/off ratio is over 10^8.Comment: submitted to IEEE Electron Device Letter
The Inuence of Misspecified Covariance on False Discovery Control when Using Posterior Probabilities
This paper focuses on the influence of a misspecified covariance structure on
false discovery rate for the large scale multiple testing problem.
Specifically, we evaluate the influence on the marginal distribution of local
fdr statistics, which are used in many multiple testing procedures and related
to Bayesian posterior probabilities. Explicit forms of the marginal
distributions under both correctly specified and incorrectly specified models
are derived. The Kullback-Leibler divergence is used to quantify the influence
caused by a misspecification. Several numerical examples are provided to
illustrate the influence. A real spatio-temporal data on soil humidity is
discussed.Comment: 22 pages, 5 figure
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