Scanning microscopy of magnetic domains using the Fe 3p3p core level transverse magneto-optical Kerr effect

We demonstrate the feasibility of the vacuum ultraviolet analog to visible-light magneto-optical imaging of magnetic structures using the resonantly enhanced transverse magneto-optical Kerr effect at core level thresholds with incident p-polarized radiation. The advantages are element specificity and a variable information depth. We used the scanning x-ray microscope at HASYLAB capable of obtaining about 1 μm resolution by means of its focusing ellipsoidal ring mirror. The p-polarized component of the reflected light was selected using multilayer reflection at an additional plane mirror downstream to the sample. Micrographs of the optical reflectivity were taken in the vicinity of the Fe 3p3p core level threshold at 53.7 and 56.5 eV photon energy where the magneto-optical effect is of opposite sign. Magnetic domains are visible in the difference of both recorded images

Soft X-ray spectromicroscopy

In recent years much progress has been made in the field of spectromicroscopy, the combination of spectroscopy with lateral resolution. This method is applicated increasingly to problems in biology, material and surface science. Different technical approaches will be outlined and discussed with respect to their imaging and spectroscopic properties.The scanning soft x-ray microscope at HASYLAB has been equipped continuously with new operating modes and has now the capability to use photoelectrons, photodesorbed ions, luminescence, fluorescence, scattered and transmitted photons for imaging and spectroscopy. Examinations of artificial structures, of luminescent ceramics and crystals and of porous silicon will be presented

Transverse magneto-optical Kerr effect of Fe at the Fe 3p threshold

We have studied the transverse magneto-optical Kerr effect of a Fe[(5.7% Si)001] sample and of ultrathin films of Fe evaporated onto Ag(001) in the soft-x-ray regime at the 3p core level threshold of Fe. We test the relationship between the asymmetries in the reflectivity and in the total photoyield which have been measured simultaneously