34 research outputs found

    Tiefenverteilung der Anregung charakteristischer Röntgenstrahlung in Kupfer durch 12 bis 30 keV-Elektronen.

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    The depth distribution of characteristic X-ray production in copper by 12 to 30 keV electrons has been measured with a zink tracer. The results are examined in terms of characteristic distribution parameters which show a potential law energy dependence. Reduction of the depth data and the electron energies by means of electron range and excitation energy, respectively, allows comparison with experimental and theoretical results of other authors on various target-tracer-combinations. Although a general energy dependence is found for the majority of the reduced characteristic parameters the accuracy of the data is not satisfying. Some of the measured distributions obviously contain large systematical errors

    Ion-induced electron emission from solids Revised version of the report Juel--2317

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    A review of ion-induced electron emission is presented which concentrates on the mechanisms relevant to imaging, analysis and processing of surfaces by ion beams. In this field of applications, the main interest in electron emission lies in kinetic emission by heavy, i.e. multi-electron (Z>2) ions of energy #<=#100 keV. The subjects are organized in. (orig.)255 refs.Available from TIB Hannover: RA 831(3098) / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekSIGLEDEGerman

    Physical sputtering of elemental metals and semiconductors

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    To be published in Proc. NATO Advanced Study Institute on Erosion and Growth of Solids Stimulated by Atom and Ion Beams, Carter, G.; Kiriakidis, G.; Whitton, J.L. (eds.), Heraklion Crete, Sept. 1985SIGLECopy held by FIZ Karlsruhe; available from UB/TIB Hannover / FIZ - Fachinformationszzentrum Karlsruhe / TIB - Technische InformationsbibliothekDEGerman

    The theory of reoil mixing in solids

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    With 32 refs.; German title: Die Theorie der Stossmischung in Festkoerpern; to be published in Topics in Current Physics, H.E. Oechsner (ed.), Springer Heidelberg (Germany, F.R.)SIGLEDEGerman

    Collisions of Slow Ions C 3

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