Summary of Experimental Meson Physics

A summary of the present experimental status of meson physics is presented. The presentation includes the new results presented at the MESON06 workshop, as well as other recent experimental developments in the field.Comment: 15 pages, 6 figures, presented at 9th International Workshop on Meson Production, Properties and Interaction, Krakow, Poland, June 200

Calibration of shielded microwave probes using bulk dielectrics

A stripline-type near-field microwave probe is microfabricated for microwave impedance microscopy. Unlike the poorly shielded coplanar probe that senses the sample tens of microns away, the stripline structure removes the stray fields from the cantilever body and localizes the interaction only around the focused-ion beam deposited Pt tip. The approaching curve of an oscillating tip toward bulk dielectrics can be quantitatively simulated and fitted to the finite-element analysis result. The peak signal of the approaching curve is a measure of the sample dielectric constant and can be used to study unknown bulk materials.Comment: 10 pages, 3 figure

Modeling of a Cantilever-Based Near-Field Scanning Microwave Microscope

We present a detailed modeling and characterization of our scalable microwave nanoprobe, which is a micro-fabricated cantilever-based scanning microwave probe with separated excitation and sensing electrodes. Using finite-element analysis, the tip-sample interaction is modeled as small impedance changes between the tip electrode and the ground at our working frequencies near 1GHz. The equivalent lumped elements of the cantilever can be determined by transmission line simulation of the matching network, which routes the cantilever signals to 50 Ohm feed lines. In the microwave electronics, the background common-mode signal is cancelled before the amplifier stage so that high sensitivity (below 1 atto-Farad capacitance changes) is obtained. Experimental characterization of the microwave probes was performed on ion-implanted Si wafers and patterned semiconductor samples. Pure electrical or topographical signals can be realized using different reflection modes of the probe.Comment: 7 figure

Cusp-scaling behavior in fractal dimension of chaotic scattering

A topological bifurcation in chaotic scattering is characterized by a sudden change in the topology of the infinite set of unstable periodic orbits embedded in the underlying chaotic invariant set. We uncover a scaling law for the fractal dimension of the chaotic set for such a bifurcation. Our analysis and numerical computations in both two- and three-degrees-of-freedom systems suggest a striking feature associated with these subtle bifurcations: the dimension typically exhibits a sharp, cusplike local minimum at the bifurcation.Comment: 4 pages, 4 figures, Revte