Significant reduction in arc frequency biased solar cells: Observations, diagnostics, and mitigation technique(s)

A variety of experiments were performed which identify key factors contributing to the arcing of negatively biased high voltage solar cells. These efforts have led to reduction of greater than a factor of 100 in the arc frequency of a single cell following proper remediation procedures. Experiments naturally lead to and focussed on the adhesive/encapsulant that is used to bond the protective cover slip to the solar cell. An image-intensified charge coupled device (CCD) camera system recorded UV emission from arc events which occurred exclusively along the interfacial edge between the cover slip and the solar cell. Microscopic inspection of this interfacial region showed a bead of encapsulant along this entire edge. Elimination of this encapsulant bead reduced the arc frequency by two orders of magnitude. Water contamination was also identified as a key contributor which enhances arcing of the encapsulant bead along the solar cell edge. Spectrally resolved measurements of the observable UV light shows a feature assignable to OH(A-X) electronic emission, which is common for water contaminated discharges. Experiments in which the solar cell temperature was raised to 85 C showed a reduced arcing frequency, suggesting desorption of H2O. Exposing the solar cell to water vapor was shown to increase the arcing frequency. Clean dry gases such as O2, N2, and Ar show no enhancement of the arcing rate. Elimination of the exposed encapsulant eliminates any measurable sensitivity to H2O vapor

Arcing in space structures in low Earth orbit

This report describes results of an experimental and theoretical program to investigate arcing of structures containing dielectric and conducting materials when they are biased negatively with respect to a plasma. An argon ion source generated Ar(+) ions of directed energy 20 to 40 eV and density approximately 10(exp 7) cm(exp -3) that impinged upon samples containing a dielectric material on top of a negatively biased Kovar plate. Arcing events were studied for bias voltages between -300 and -1000V with respect to the ion beam. The samples were Dow Corning 93-500 adhesive on Kovar, fused silica cover slips bonded on Kovar, and silicon solar cells mounted on Kovar. Measurements of discharge current, Kovar plate voltage, and radiation from the arc versus time were carried out. Microsecond duration exposure images and optical spectra in the 0.24 to 0.40 micron band were also acquired during arcing events. Arcing events were found to be associated with exposed adhesive and means were found to eliminate arcing altogether. The charging of a silica cover plate and the fields around the plate were calculated using a particle-in-cell code. Models were developed to explain the ignition of the arc and the physical processes occurring during the discharge

Direct evidence for base-mediated decomposition of alkyl hydroperoxides (ROOH) in the gas phase

Alkyl hydroperoxides (ROOH) are attributed a key role in the biochemical oxidation of lipids during oxidative stress.1 In this chemistry ROOH compounds, where the R groups are unsaturated fatty acids, are viewed as transient ntermediates which are readily degraded, due to the lability of the RO-OH bond, to yield potentially genotoxic aldehydes and ketones.2 Generally, the decomposition of alkyl hydroperoxides is thought to be mediated by radical abstraction or electron transfer processes usually involving enzymes, transition metals, or recently, Vitamin C.3 In this paper we present the first unambiguous experimental and computational evidence for base-mediated heterolytic decomposition of simple alkyl hydroperoxides by the mechanism outlined in Scheme 1