80 research outputs found

    Towards a Universal Hot Carrier Degradation Model for SiGe HBTs Subjected to Electrical Stress

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    The objective of this work is to develop a generalizable understanding of the degradation mechanisms present in complementary Silicon-Germanium (SiGe) heterojunction bipolar transistors (HBTs) that can be used to not only predict the reliable lifetime of these devices but also overcome some of these aging limitations using clever device engineering. This broad motivation for understanding and improving SiGe HBT device reliability is explored through the following specific goals: 1) develop an understanding of the dominant hot carrier degradation sources across temperature (25 K – 573 K); 2) develop a broad understanding of all potentially vulnerable regions of damage within a SiGe HBT using electrically measured data, and how these degradations can be captured in a modeling framework; and 3) design optimized SiGe HBTs that can potentially overcome some of these device-level limitations in reliability across temperature. Being able to simulate the electrical degradation of a complex circuit with SiGe HBTs swinging dynamically on the output plane using a universal physics-based aging model is invaluable for any circuit designer optimizing for high performance and reliability.Ph.D

    Detection of Denial of Service (DoS) Attacks in VANET using Filters

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    Vehicular Ad-Hoc Networks (VANET) are considered as a subset of Mobile Ad-Hoc Networks (MANET). VANET is mainly used for the construction of an intelligent transport system. VANET enables communication between the vehicles (V2V) and vehicles to infrastructure (V2I). VANET can be used to coordinate the traffic, improve safety measures, support the drivers for hassle-free driving. It plays a major role in building smart cities in the near future. VANET is vulnerable to a number of security issues among which the DoS attack is a major part. DoS attack in VANET involves a malicious node flooding a huge amount of traffic using spoofed identities. This, in turn, may disrupt the services of vehicles in the network. The detection of the attack becomes very difficult due to fake identities. The detection scheme uses a cuckoo filter and IP detection technique to detect the attack in the network. Once the attack is detected it generates a broadcast message to all the other vehicles that are present in the network

    TCAD modeling of mixed-mode degradation in SiGe HBTs

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    The objective of this work is to develop an effective TCAD based hot-carrier degradation model in predicting the damage that a SiGe HBT undergoes as it is stressed across bias, time and temperature.M.S
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