1,757 research outputs found

    Large signal 2nd harmonic on wafer MESFET characterization

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    An automatic test set which performs a real time harmonic load-pull characterization is proposed. An active load technique is used in order to set the load at the test frequency and its harmonics and a complete set of device parameters useful for power amplifier design purposes can be measured versus the harmonic loads. The calibration procedure, based on substrate and coaxial standards, has been mainly developed for on wafer measurement in order to set the reference planes directly on the DU

    Save the "THRU" in the A.N.A. calibration

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    The conventional network analyzer (NWA) two-port calibration procedures require a standard thru line to be connected between the ports. Unfortunately in many applications, for example when measuring MMIC or on-wafer devices with not aligned ports, a custom thru line must be used. The procedure here applied overcomes the difficulty due to the poor knowledge of this thru element since it is based on a generic reciprocal unknown two port structure, provided that its S21 phase shift is roughly known. Some experimental comparisons with other well sound calibration techniques will be here presented where different reciprocal two-port structures were used as unknown thr

    Novel software techniques for automatic microwave measurements

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    Although many microwave measurement techniques are heavily based on special purpose software, the application of modern software techniques like object oriented programming and new programming language like C++ is seldom used. The impact of such new software solutions can drastically improve the overall design of a microwave test set. The paper presents the design and implementation of a new multiport network analyzer with particular attention to the control program architecture. The use of Object Oriented Programming techniques results in a clear and easy to maintain solution which boosts both the user interface and the overall test set organizatio

    Three port device S-parameter characterization by means of an original three port test set

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    A three-port network analyzer, implemented using commercial available hardware is presented, Test set calibration is accomplished through a particular calibration procedure which requires only conventional standards, used for two-port applications, and minimizes the number of their connections. Experimental verification was carried out through measurement of a directional cou­pler and several devices with one and two ports
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