High-temperature etching of SiC in SF6_{6}/O2_{2} inductively coupled plasma

In this work, we demonstrate an effective way of deep (30 µm depth), highly oriented (90° sidewall angle) structures formation with sub-nanometer surface roughness (R$_{ms}$ = 0.7 nm) in silicon carbide (SiC). These structures were obtained by dry etching in SF$_{6}$/O$_{2}$ inductively coupled plasma (ICP) at increased substrate holder temperatures. It was shown that change in the temperature of the substrate holder in the range from 100 to 300 °C leads to a sharp decrease in the root mean square roughness from 153 to 0.7 nm. Along with this, it has been established that the etching rate of SiC also depends on the temperature of the substrate holder and reaches its maximum (1.28 µm/min) at temperatures close to 150 °C. Further temperature increase to 300 °C does not lead to the etching rate rising. The comparison of the results of the thermally stimulated process and the etching with a water-cooled substrate holder (15 °C) is carried out. Plasma optical emission spectroscopy was carried out at different temperatures of the substrate holder

Heterodyne determination of the width of the emission lines of injection lasers in the beat frequency stabilization regime

A servo system was used to lock the beat frequency of injection lasers operating under conditions of self-stabilization of single-frequency emission in an anomalously wide continuous tuning range. The width of the beat spectrum was found to be ~500 Hz