3 research outputs found
First-Principles Calculations on the Crystal/Electronic Structure and Phase Stability of H‑Doped SrFeO<sub>2</sub>
It has been recently
reported that H-doping of SrFeO<sub>2</sub> induces an insulator-to-metal
transition but generates only a small
amount of carrier electrons. To investigate the crystal structure
of H-doped SrFeO<sub>2</sub> (SFOH) and the origin of its peculiar
transport properties, we performed DFT-based first-principles calculations.
Through structural sampling and total energy calculations, we showed
that the doped hydrogen atoms exist in hydride form (H<sup>–</sup>). Incorporation of the hydride drastically changed the valence state
or the d-band configuration of the Fe ions adjacent to the doped hydride,
resulting in a metallic density of states in specific hydride configurations.
Thermodynamic analysis revealed that the formation of an insulating
phase with O-site hydride was energetically preferable, but metallic
phases with O-site hydride or interstitial hydride could also be present
at reaction temperature, suggesting that SFOH is a mixture of an insulating
matrix and metallic domains. This two-phase model accounted for the
observed low carrier density as well as the metallic transport properties
Ferrimagnetism and Ferroelectricity in Cr-Substituted GaFeO<sub>3</sub> Epitaxial Films
GaFeO<sub>3</sub>-type iron oxides
are promising multiferroic materials
due to the coexistence of a large spontaneous magnetization and polarization
near room temperature. However, magnetic substitution, which is a
general method to control multiferroic properties, is difficult due
to instability of the substituted GaFeO<sub>3</sub>. In this study,
Ga<sub>0.5</sub>Cr<sub>0.5</sub>FeO<sub>3</sub> epitaxial thin films
are successfully fabricated through epitaxial stabilization. These
films exhibit in-plane ferrimagnetism and out-of-plane ferroelectricity
simultaneously. X-ray absorption spectroscopy and X-ray magnetic circular
dichroism measurements of the Ga<sub>0.5</sub>Cr<sub>0.5</sub>FeO<sub>3</sub> film reveal that the oxidation states of the Fe and Cr ions
are trivalent. In addition, some Fe ions are located at tetrahedral
Ga1 sites. Compared to the GaFeO<sub>3</sub> film, the Ga<sub>0.5</sub>Cr<sub>0.5</sub>FeO<sub>3</sub> film shows a higher magnetic phase
transition temperature (240 K), weaker saturation magnetization at
5 K, and a unique temperature dependence of the magnetization behavior.
The effects of Cr substitution on the magnetic properties are strongly
affected by the sites of the Fe<sup>3+</sup> (3d<sup>5</sup>) and
Cr<sup>3+</sup> (3d<sup>3</sup>) ions. Furthermore, room-temperature
ferroelectricity in the GaFeO<sub>3</sub> and Ga<sub>0.5</sub>Cr<sub>0.5</sub>FeO<sub>3</sub> films was demonstrated. Interestingly, the
change in the ferroelectric parameters via Cr substitution is very
small, which disagrees with the previously proposed polarization switching
mechanism. Our findings are key to understanding the genuine polarization
switching mechanism of the multiferroic GaFeO<sub>3</sub> system
Reversible Changes in Resistance of Perovskite Nickelate NdNiO<sub>3</sub> Thin Films Induced by Fluorine Substitution
Perovskite
nickel oxides are of fundamental as well as technological interest
because they show large resistance modulation associated with phase
transition as a function of the temperature and chemical composition.
Here, the effects of fluorine doping in perovskite nickelate NdNiO<sub>3</sub> epitaxial thin films are investigated through a low-temperature
reaction with polyvinylidene fluoride as the fluorine source. The
fluorine content in the fluorinated NdNiO<sub>3–<i>x</i></sub>F<sub><i>x</i></sub> films is controlled with precision
by varying the reaction time. The fully fluorinated film (<i>x</i> ≈ 1) is highly insulating and has a bandgap of
2.1 eV, in contrast to NdNiO<sub>3</sub>, which exhibits metallic
transport properties. Hard X-ray photoelectron and soft X-ray absorption
spectroscopies reveal the suppression of the density of states at
the Fermi level as well as the reduction of nickel ions (valence state
changes from +3 to +2) after fluorination, suggesting that the strong
Coulombic repulsion in the Ni 3d orbitals associated with the fluorine
substitution drives the metal-to-insulator transition. In addition,
the resistivity of the fluorinated films recovers to the original
value for NdNiO<sub>3</sub> after annealing in an oxygen atmosphere.
By application of the reversible fluorination process to transition-metal
oxides, the search for resistance-switching materials could be accelerated