20 research outputs found
Analyse du bruit basses fréquences du courant de drain de HEMTs AlGaN/GaN sur substrats silicium et saphir
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Low frequency drain noise comparison of AlGaN/GaN HEMT's grown on silicon, SiC and sapphire substrates
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Different failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
No full textInternational audienc
Different failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
No full textInternational audienc
Application of various optical techniques for ESD defect localization
No full textInternational audienceVarious optical defect localization techniques are applied on the same integrated circuits (IC). These circuits were previously stressed by Electro Static Discharges (ESD) to create defects. The results obtained by each technique were analyzed to determine the nature of the defects. The different data are compared to assess their sensitivity and to evaluate the contribution of each technique in a failure analysis flo
