Structure of ball-milled ZrO_2 and ZrO_2 -10 mol % Y_2O_3 powders revealed by HRTEM image processing

High-resolution transmission electron microscope (HRTEM) image processing analysis is used to analyse and to compare the process of ball milling in pure ZrO_2 powders and in ZrO_2-10 mol % Y_2O_3 powders. Applying HRTEM image processing to the grain boundary region and other defects, we are able to observe, at the atomic level, a possible sequence of alloying and transition that occur at the grain boundary, in the overlapping layers and on the stacking faults

Otkrivanje strukture kuglama mljevenih prahova ZrO2 I ZrO2 -10 mol % Y2O3 obradom slika HRTEM

High-resolution transmission electron microscope (HRTEM) image processing analysis is used to analyse and to compare the process of ball milling in pure ZrO2 powders and in ZrO2-10 mol % Y2O3 powders. Applying HRTEM image processing to the grain boundary region and other defects, we are able to observe, at the atomic level, a possible sequence of alloying and transition that occur at the grain boundary, in the overlapping layers and on the stacking faults.Primijenili smo analizu obradom slika iz transmisijskog elektronskog mikroskopa visokog razlučivanja (HRTEM) radi usporedbe procesa mljevenja kuglama čistog praha ZrO2 i praha ZrO2-10 mol % Y2O3. Primjenom obrade slika HRTEM za granične dijelove zrnaca i za druge defekte, uspjeli smo, na atomskoj razini, opažati moguće sljedove tvorbe slitina i prijelaza koji se dešavaju na granicama zrnaca, u preklopima slojeva i u pogreškama gomilanja

Primjenjivost različitih metoda analize profila linija XRD za ocjenjivanje veličine zrnaca i mikronaprezanja u tankim slojevima volframa

Different methods of X-ray diffraction line profile analysis (XRDLPA) are used to study microstructural parameters such as crystallite size (diffracted domain size), microstrain and texture in tungsten thin films deposited on glass by DC magnetron sputtering at different substrate temperatures and at different working-gas pressures. The whole-pattern analysis within the Rietveld method, the "single-line" method and "double Voigt" method (equivalent to the Warren-Averbach method) are applied and mutually compared. In addition, the results obtained by the Scherrer method are also discussed. The line broadening has been found to be isotropic, supporting the reliability of usage of the Rietveld method in the size-microstrain extraction.Primijenili smo različite metode za analizu profila linija rendgenske difrakcije radi proučavanja mikrostrukturnih parametara, kao što su veličina kristalita (veličina difrakcijskih domena), mikronaprezanja i struktura u tankim slojevima volframa naparenim na staklo magnetronskim DC rasprašivanjem pri različitim temperaturama podloge i radnim tlakovima plina. Primijenili smo cjelovitu analizu spektara Rietveldovom metodom, metodom “jedne linije” i metodom “dvo-Voigta” (jednakovaljanog metodi Warrena-Averbacha) i usporedili ih. Nadalje, raspravljamo i rezultate dobivene Scherrerovom metodom. Nalazimo da je širenje linija izotropno, što potvrđuje pouzdanost primjene Rietveldove metode za izvođenje veličine i mikronaprezanja

On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films

Different methods of X-ray diffraction line profile analysis (XRDLPA) are used to study microstructural parameters such as crystallite size (diffracted domain size), microstrain and texture in tungsten thin films deposited on glass by DC magnetron sputtering at different substrate temperatures and at different working-gas pressures. The whole-pattern analysis within the Rietveld method, the "single-line" method and "double Voigt" method (equivalent to the Warren-Averbach method) are applied and mutually compared. In addition, the results obtained by the Scherrer method are also discussed. The line broadening has been found to be isotropic, supporting the reliability of usage of the Rietveld method in the size-microstrain extraction