16 research outputs found
Lateral Versus Vertical Growth of Two-Dimensional Layered Transition-Metal Dichalcogenides: Thermodynamic Insight into MoS<sub>2</sub>
Unprecedented interest has been spurred
recently in two-dimensional
(2D) layered transition metal dichalcogenides (TMDs) that possess
tunable electronic and optical properties. However, synthesis of a
wafer-scale TMD thin film with controlled layers and homogeneity remains
highly challenging due mainly to the lack of thermodynamic and diffusion
knowledge, which can be used to understand and design process conditions,
but falls far behind the rapidly growing TMD field. Here, an integrated
density functional theory (DFT) and calculation of phase diagram (CALPHAD)
modeling approach is employed to provide thermodynamic insight into
lateral versus vertical growth of the prototypical 2D material MoS<sub>2</sub>. Various DFT energies are predicted from the layer-dependent
MoS<sub>2</sub>, 2D flake-size related mono- and bilayer MoS<sub>2</sub>, to Mo and S migrations with and without graphene and sapphire substrates,
thus shedding light on the factors that control lateral versus vertical
growth of 2D islands. For example, the monolayer MoS<sub>2</sub> flake
in a small 2D lateral size is thermodynamically favorable with respect
to the bilayer counterpart, indicating the monolayer preference during
the initial stage of nucleation; while the bilayer MoS<sub>2</sub> flake becomes stable with increasing 2D lateral size. The critical
2D flake-size of phase stability between mono- and bilayer MoS<sub>2</sub> is adjustable via the choice of substrate. In terms of DFT
energies and CALPHAD modeling, the size dependent pressureâtemperatureâcomposition
(<i>P</i>-<i>T</i>-<i>x</i>) growth
windows are predicted for MoS<sub>2</sub>, indicating that the formation
of MoS<sub>2</sub> flake with reduced size appears in the middle but
close to the lower <i>T</i> and higher <i>P</i> âGas + MoS<sub>2</sub>â phase region. It further suggests
that Mo diffusion is a controlling factor for MoS<sub>2</sub> growth
owing to its extremely low diffusivity compared to that of sulfur.
Calculated MoS<sub>2</sub> energies, Mo and S diffusivities, and size-dependent <i>P</i>-<i>T</i>-<i>x</i> growth windows are
in good accord with available experiments, and the present data provide
quantitative insight into the controlled growth of 2D layered MoS<sub>2</sub>
Effect of the Ligand Structure on Chemical Vapor Deposition of WN<sub><i>x</i></sub>C<sub><i>y</i></sub> Thin Films from Tungsten Nitrido Complexes of the Type WN(NR<sub>2</sub>)<sub>3</sub>
Tungsten nitrido complexes of the
type WNÂ(NR<sub>2</sub>)<sub>3</sub> [NR<sub>2</sub> = combinations
of NMe<sub>2</sub>, NEt<sub>2</sub>, N<sup><i>i</i></sup>Pr<sub>2</sub>, N<sup><i>n</i></sup>Pr<sub>2</sub>, N<sup><i>i</i></sup>Bu<sub>2</sub>, piperidine, and azepane]
were synthesized as precursors for aerosol-assisted
chemical vapor deposition of WN<sub><i>x</i></sub>C<sub><i>y</i></sub> thin films. The effects of the amido substituents
on precursor volatility and decomposition were evaluated experimentally
and computationally. Films deposited using WNÂ(NMe<sub>2</sub>)Â(N<sup><i>i</i></sup>Pr<sub>2</sub>)<sub>2</sub> as a single-source precursor were assessed as diffusion barrier
materials for Cu metallized integrated circuits in terms of growth
rate, surface roughness, composition, and density. In diffusion barrier
tests, Cu (âŒ100 nm)/WN<sub><i>x</i></sub>C<sub><i>y</i></sub> (âŒ5 nm)/Si samples prepared from WNÂ(NMe<sub>2</sub>)Â(N<sup><i>i</i></sup>Pr<sub>2</sub>)<sub>2</sub> were annealed for 30 min at 500 °C and successfully
blocked Cu penetration according to four-point probe, X-ray diffraction,
scanning electron microscopy etch-pit test, and high-resolution transmission
electron microscopy measurements
Plot of the model fits (red dots) to observed data (grey violin plots, with a black bar representing the interquartile range) aggregated by country.
<p>Number of dots per site indicates the number of contributing distributions. The position of the dot on the y-axis represents the geometric mean of the distribution and the size of the dot represents the relative contribution of that subgroup to the full distribution.</p
Demographic characteristics on admission of patients enrolled in antimalarial drug efficacy trials who received MAS<sub>3</sub>, between 1995 and 2007.
<p>Demographic characteristics on admission of patients enrolled in antimalarial drug efficacy trials who received MAS<sub>3</sub>, between 1995 and 2007.</p
Model predictions for the probability that an infection with a given clearance half-life is resistant.
<p>This relationship is predicted to be dependent on the underlying proportion of âresistantâ infections in the study population. The relationships for underlying proportions âresistantâ of 0.1 (green), 0.5 (blue), and 0.9 (purple) are shown. The shaded areas represent the 50%, 80%, 90%, and 95% prediction intervals (from dark to light shading, respectively).</p
Summary of the data from the Thai-Myanmar border stratified by year.
<p>Summary of the data from the Thai-Myanmar border stratified by year.</p
Drug sensitivity of <i>P. falciparum</i> isolates for artesunate (Figure 4a) and mefloquine (Figure 4b).
<p>Isolates from primary infections were collected at SMRU clinics between 1995 and 2007 and assayed for sensitivity to artesunate and mefloquine, IC<sub>50</sub> geometric means are given as nM/l with [95% CI].</p
PCR-confirmed novel and recrudescent infections and time to recrudescence.
<p>PCR-confirmed novel and recrudescent infections and time to recrudescence.</p
Percentage of patients who had cleared parasitaemia at Day-2 and Day-3 1995â2007.
<p>Percentage of patients who had cleared parasitaemia at Day-2 and Day-3 1995â2007.</p