16 research outputs found

    Lateral Versus Vertical Growth of Two-Dimensional Layered Transition-Metal Dichalcogenides: Thermodynamic Insight into MoS<sub>2</sub>

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    Unprecedented interest has been spurred recently in two-dimensional (2D) layered transition metal dichalcogenides (TMDs) that possess tunable electronic and optical properties. However, synthesis of a wafer-scale TMD thin film with controlled layers and homogeneity remains highly challenging due mainly to the lack of thermodynamic and diffusion knowledge, which can be used to understand and design process conditions, but falls far behind the rapidly growing TMD field. Here, an integrated density functional theory (DFT) and calculation of phase diagram (CALPHAD) modeling approach is employed to provide thermodynamic insight into lateral versus vertical growth of the prototypical 2D material MoS<sub>2</sub>. Various DFT energies are predicted from the layer-dependent MoS<sub>2</sub>, 2D flake-size related mono- and bilayer MoS<sub>2</sub>, to Mo and S migrations with and without graphene and sapphire substrates, thus shedding light on the factors that control lateral versus vertical growth of 2D islands. For example, the monolayer MoS<sub>2</sub> flake in a small 2D lateral size is thermodynamically favorable with respect to the bilayer counterpart, indicating the monolayer preference during the initial stage of nucleation; while the bilayer MoS<sub>2</sub> flake becomes stable with increasing 2D lateral size. The critical 2D flake-size of phase stability between mono- and bilayer MoS<sub>2</sub> is adjustable via the choice of substrate. In terms of DFT energies and CALPHAD modeling, the size dependent pressure–temperature–composition (<i>P</i>-<i>T</i>-<i>x</i>) growth windows are predicted for MoS<sub>2</sub>, indicating that the formation of MoS<sub>2</sub> flake with reduced size appears in the middle but close to the lower <i>T</i> and higher <i>P</i> “Gas + MoS<sub>2</sub>” phase region. It further suggests that Mo diffusion is a controlling factor for MoS<sub>2</sub> growth owing to its extremely low diffusivity compared to that of sulfur. Calculated MoS<sub>2</sub> energies, Mo and S diffusivities, and size-dependent <i>P</i>-<i>T</i>-<i>x</i> growth windows are in good accord with available experiments, and the present data provide quantitative insight into the controlled growth of 2D layered MoS<sub>2</sub>

    Effect of the Ligand Structure on Chemical Vapor Deposition of WN<sub><i>x</i></sub>C<sub><i>y</i></sub> Thin Films from Tungsten Nitrido Complexes of the Type WN(NR<sub>2</sub>)<sub>3</sub>

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    Tungsten nitrido complexes of the type WN­(NR<sub>2</sub>)<sub>3</sub> [NR<sub>2</sub> = combinations of NMe<sub>2</sub>, NEt<sub>2</sub>, N<sup><i>i</i></sup>Pr<sub>2</sub>, N<sup><i>n</i></sup>Pr<sub>2</sub>, N<sup><i>i</i></sup>Bu<sub>2</sub>, piperidine, and azepane] were synthesized as precursors for aerosol-assisted chemical vapor deposition of WN<sub><i>x</i></sub>C<sub><i>y</i></sub> thin films. The effects of the amido substituents on precursor volatility and decomposition were evaluated experimentally and computationally. Films deposited using WN­(NMe<sub>2</sub>)­(N<sup><i>i</i></sup>Pr<sub>2</sub>)<sub>2</sub> as a single-source precursor were assessed as diffusion barrier materials for Cu metallized integrated circuits in terms of growth rate, surface roughness, composition, and density. In diffusion barrier tests, Cu (∌100 nm)/WN<sub><i>x</i></sub>C<sub><i>y</i></sub> (∌5 nm)/Si samples prepared from WN­(NMe<sub>2</sub>)­(N<sup><i>i</i></sup>Pr<sub>2</sub>)<sub>2</sub> were annealed for 30 min at 500 °C and successfully blocked Cu penetration according to four-point probe, X-ray diffraction, scanning electron microscopy etch-pit test, and high-resolution transmission electron microscopy measurements

    Model predictions for the probability that an infection with a given clearance half-life is resistant.

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    <p>This relationship is predicted to be dependent on the underlying proportion of ‘resistant’ infections in the study population. The relationships for underlying proportions ‘resistant’ of 0.1 (green), 0.5 (blue), and 0.9 (purple) are shown. The shaded areas represent the 50%, 80%, 90%, and 95% prediction intervals (from dark to light shading, respectively).</p
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