Development and Human Rights Montreux, 4. -8

ABSTRACT Measurement of Wastage and therefore of Efficiency of Education The paper first brings out the need for preparing proper data base for framing and then implementation of national policies on education. Such a data base will also help to increase the efficiency of education. Then it discusses briefly the theory of investment in human capital (Adhvaryu, 1969 and IIEP, 198

Generalized class of composite method of estimation for crop acreage in small domain

This paper defines and discusses a generalized class of composite estimators for small domains, using auxiliary information, under systematic sampling scheme. The generalized class of composite estimators, among others, includes a number of direct, synthetic and composite estimators. Further, it demonstrates the use of the estimators belonging to the generalized class for estimating crop acreage for small domains and also compares their relative performance with the corresponding direct and synthetic estimators, through a simulation study

Generalized class of synthetic estimators for small areas under systematic sampling scheme

This paper defines and discusses a generalized class of synthetic estimators for small domain, using auxiliary information, under systematic sampling scheme. The generalized class of synthetic estimators, among others, includes the simple, ratio and product synthetic estimators. Further, it demonstrates the use of the generalized synthetic and ratio synthetic estimators for estimating crop acreage for small domain and also compares their relative performance with direct estimators, empirically, through a simulation study

Generalized class of synthetic estimators for small areas under systematic sampling scheme

This paper defines and discusses a generalized class of synthetic estimators for small domain, using auxiliary information, under systematic sampling scheme. The generalized class of synthetic estimators, among others, includes the simple, ratio and product synthetic estimators. Further, it demonstrates the use of the generalized synthetic and ratio synthetic estimators for estimating crop acreage for small domain and also compares their relative performance with direct estimators, empirically, through a simulation study

Generalized class of composite method of estimation for crop acreage in small domain

This paper defines and discusses a generalized class of composite estimators for small domains, using auxiliary information, under systematic sampling scheme. The generalized class of composite estimators, among others, includes a number of direct, synthetic and composite estimators. Further, it demonstrates the use of the estimators belonging to the generalized class for estimating crop acreage for small domains and also compares their relative performance with the corresponding direct and synthetic estimators, through a simulation study

Synthetic and composite estimators for small area estimation under Lahiri – Midzuno sampling scheme

This paper studies performance of synthetic ratio estimator and composite estimator, which is a weighted sum of direct and synthetic ratio estimators, under Lahiri – Midzuno (L-M) sampling scheme. The synthetic estimator under L-M scheme is unbiased and consistent if the assumption of synthetic estimator is satisfied. Further, this paper compares performance of the synthetic and composite estimators empirically under L-M and SRSWOR schemes for estimating crop acreage for small domains. The study shows that both the estimators perform better under L-M scheme as having comparatively smaller absolute relative biases and relative standard errors

Investigation of multilayer thin films using ellipsometry

Light emission from silicon-based materials is a very important research area for optoelectronic and display applications. It is important to derive a practical light source from silicon in order to have complete photonic integrated circuits on silicon. An efficient silicon based light emitting device would revolutionize the silicon photonics field, and thus numerous efforts have been undertaken to develop silicon as a viable optical material. Not only will the Silicon based light source be able to provide an easy route to integrate with silicon electronics but also be compatible with current fabrication technology. In this work, the optical properties of a-SiNx:H/Si02 multi layers thin films have been investigated using spectroscopic ellipsometry (SE). Plasma Enhanced Chemical Vapor Deposition (PECVD) was used to fabricate multilayer thin films. The ellipsometric data was acquired using a rotating analyzer J. A. Woollam variable angle spectroscopic ellipsometer in the wavelength range of 270 nm to 1700. The SE experiments conducted were quite extensive in terms of the range of energy and the angles at which the measurements were performed. SE itself is not a direct readout type technique. It is actually a model-based technique. Thus, it is important to build correct and suitable model for a particular material in the SE fitting. In this project, several dispersion models are investigated to find the one which is best suitable for the fitting of a-SRN. The fitting of the ellipsometric data was carried out using the WVASE32™ software. Several samples were characterized using SE and the data were fitted by software Wvase32 using two dispersion models: Tauc-Lorentz (TL) model and TL with the inclusion of the Urbach tail. Optical constants for the single layer as well as multilayer thin films were obtained using both TL and TLU models. The optical constants obtained from both the models have been compared. Thickness of the films, barrier and bulk layer obtained through SE have been compared with the TEM results and are found to be in agreement with each other, thus verifying the accuracy of the SE results. Results obtained from both the models were also compared and it was observed that TLU gave better results.Master of Science (Electronics

Crop Acreage and Crop Production Estimates for Small Domains - Revisited

For any country advance and final estimates of yield of principle crops, at National and State levels, are of great importance for its macro level planning. But, for decentralized planning and for other purposes like crop insurance, loan to farmers, etc., the reliable estimates of crop production for small domains are also in great demand. This paper, therefore, discusses and review critically the methodology used to provide crop acreage and crop production estimates for small domains, based on indirect methods of estimation, including the SICURE model approach. The indirect methods of estimation so developed use data obtained either through traditional surveys, like General Crop Estimation Surveys (GCES) data, or a combination of the surveys and satellite data