Fundamental bounds on the precision of classical phase microscopes

A wide variety of imaging systems have been designed to measure phase variations, with applications from physics to biology and medicine. In this work, we theoretically compare the precision of phase estimations achievable with classical phase microscopy techniques, operated at the shot-noise limit. We show how the Cram\'er-Rao bound is calculated for any linear optical system, including phase-contrast microscopy, phase-shifting holography, spatial light interference microscopy, and local optimization of wavefronts for phase imaging. Our results show that wavefront shaping is required to design phase microscopes with optimal phase precision

Optical Near-Field Electron Microscopy

Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide the necessary spatial resolution, electron-optical techniques damage the specimen and cause dose-induced artefacts. Here, Optical Near-field Electron Microscopy (ONEM) is proposed, an imaging technique that combines non-invasive probing with light, with a high spatial resolution read-out via electron optics. Close to the specimen, the optical near-fields are converted into a spatially varying electron flux using a planar photocathode. The electron flux is imaged using low energy electron microscopy, enabling label-free nanometric resolution without the need to scan a probe across the sample. The specimen is never exposed to damaging electrons