2 research outputs found
Direct Observation of Room-Temperature Stable Magnetism in LaAlO<sub>3</sub>/SrTiO<sub>3</sub> Heterostructures
Along with an unexpected conducting interface between nonmagnetic insulating perovskites LaAlO<sub>3</sub> and SrTiO<sub>3</sub> (LaAlO<sub>3</sub>/SrTiO<sub>3</sub>), striking
interfacial magnetisms have been observed in LaAlO<sub>3</sub>/SrTiO<sub>3</sub> heterostructures. Interestingly, the strength of the interfacial
magnetic moment is found to be dependent on oxygen partial pressures
during the growth process. This raises an important, fundamental question
on the origin of these remarkable interfacial magnetic orderings.
Here, we report a direct evidence of room-temperature stable magnetism
in a LaAlO<sub>3</sub>/SrTiO<sub>3</sub> heterostructure prepared
at high oxygen partial pressure by using element-specific soft X-ray
magnetic circular dichroism at both Ti L<sub>3,2</sub> and O K edges.
By combining X-ray absorption spectroscopy at both Ti L<sub>3,2</sub> and O K edges and first-principles calculations, we qualitatively
ascribe that this strong magnetic ordering with dominant interfacial
Ti<sup>3+</sup> character is due to the coexistence of LaAlO<sub>3</sub> surface oxygen vacancies and interfacial (Ti<sub>Al</sub>–Al<sub>Ti</sub>) antisite defects. On the basis of this new understanding,
we revisit the origin of the weak magnetism in LaAlO<sub>3</sub>/SrTiO<sub>3</sub> heterostructures prepared at low oxygen partial pressures.
Our calculations show that LaAlO<sub>3</sub> surface oxygen vacancies
are responsible for the weak magnetism at the interface. Our result
provides direct evidence on the presence of room-temperature stable magnetism and a novel perspective
to understand magnetic and electronic reconstructions at such strategic
oxide interfaces
The Mechanism of Electrolyte Gating on High‑<i>T</i><sub><i>c</i></sub> Cuprates: The Role of Oxygen Migration and Electrostatics
Electrolyte
gating is widely used to induce large carrier density
modulation on solid surfaces to explore various properties. Most of
past works have attributed the charge modulation to electrostatic
field effect. However, some recent reports have argued that the electrolyte
gating effect in VO<sub>2</sub>, TiO<sub>2</sub>, and SrTiO<sub>3</sub> originated from field-induced oxygen vacancy formation. This gives
rise to a controversy about the gating mechanism, and it is therefore
vital to reveal the relationship between the role of electrolyte gating
and the intrinsic properties of materials. Here, we report entirely
different mechanisms of electrolyte gating on two high-<i>T</i><sub><i>c</i></sub> cuprates, NdBa<sub>2</sub>Cu<sub>3</sub>O<sub>7−δ</sub> (NBCO) and Pr<sub>2–<i>x</i></sub>Ce<sub><i>x</i></sub>CuO<sub>4</sub> (PCCO), with
different crystal structures. We show that field-induced oxygen vacancy
formation in CuO chains of NBCO plays the dominant role, while it
is mainly an electrostatic field effect in the case of PCCO. The possible
reason is that NBCO has mobile oxygen in CuO chains, while PCCO does
not. Our study helps clarify the controversy relating to the mechanism
of electrolyte gating, leading to a better understanding of the role
of oxygen electro migration which is very material specific