Entanglement between a diamond spin qubit and a photonic time-bin qubit at telecom wavelength

We report on the realization and verification of quantum entanglement between an NV electron spin qubit and a telecom-band photonic qubit. First we generate entanglement between the spin qubit and a 637 nm photonic time-bin qubit, followed by photonic quantum frequency conversion that transfers the entanglement to a 1588 nm photon. We characterize the resulting state by correlation measurements in different bases and find a lower bound to the Bell state fidelity of F = 0.77 +/- 0.03. This result presents an important step towards extending quantum networks via optical fiber infrastructure

Thin layers of columns of an amphiphilic hexa-peri-hexabenzocoronene at silicon wafer surfaces

We present here the preparation and the structures of thin films of an amphiphilic hexa-peri-hexabenzocoronene (HBC) containing 1, 5, 9, and 15 layers of columns. These films were prepared by the Langmuir-Blodgett technique on poly(ethylene imine) functionalized silicon wafers and investigated by X-ray reflectivity measurements using synchrotron radiation. Columns of HBC cores were aligned parallel to the silicon wafer surface. The thicknesses of the films, which were composed of stacks of highly coherent HBC layers plus a polymer layer, were 3.70-34.6 nm. Each HBC layer has a thickness of 2.4 nm. The transfer rate of the HBC monolayers from the water/air surface to the silicon wafer surface is close to 100%. A macroscopic in-plane orientation of the columns with their main axis parallel to the dipping direction was determined by polarized UV-vis spectroscopy

Etude rétrospective de la prise en charge médicale de l'anorexie mentale en hospitalisation

REIMS-BU Santé (514542104) / SudocPARIS-BIUM (751062103) / SudocSudocFranceF

Thin layers of columns of an amphiphilic hexa-peri-hexabenzocoronene at silicon wafer surfaces

We present here the preparation and the structures of thin films of an amphiphilic hexa-peri-hexabenzocoronene (HBC) containing 1, 5, 9, and 15 layers of columns. These films were prepared by the Langmuir-Blodgett technique on poly(ethylene imine) functionalized silicon wafers and investigated by X-ray reflectivity measurements using synchrotron radiation. Columns of HBC cores were aligned parallel to the silicon wafer surface. The thicknesses of the films, which were composed of stacks of highly coherent HBC layers plus a polymer layer, were 3.70-34.6 nm. Each HBC layer has a thickness of 2.4 nm. The transfer rate of the HBC monolayers from the water/air surface to the silicon wafer surface is close to 100%. A macroscopic in-plane orientation of the columns with their main axis parallel to the dipping direction was determined by polarized UV-vis spectroscopy