3 research outputs found
Effect of Electric Field on Gas Hydrate Nucleation Kinetics: Evidence for the Enhanced Kinetics of Hydrate Nucleation by Negatively Charged Clay Surfaces
Natural
gas hydrates are found widely in oceanic clay-rich sediments,
where clay–water interactions have a profound effect on the
formation behavior of gas hydrates. However, it remains unclear why
and how natural gas hydrates are formed in clay-rich sediments in
spite of factors that limit gas hydrate formation, such as small pore
size and high salinity. Herein, we show that polarized water molecules
on clay surfaces clearly promote gas hydrate nucleation kinetics.
When water molecules were polarized with an electric field of 10<sup>4</sup> V/m, gas hydrate nucleation occurred significantly faster
with an induction time reduced by 5.8 times. Further, the presence
of strongly polarized water layers at the water–gas interface
hindered gas uptake and thus hydrate formation, when the electric
field was applied prior to gas dissolution. Our findings expand our
understanding of the formation habits of naturally occurring gas hydrates
in clay-rich sedimentary deposits and provide insights into gas production
from natural hydrate deposits
Effect of Organic Matter on CO<sub>2</sub> Hydrate Phase Equilibrium in Phyllosilicate Suspensions
In
this study, we examined various CO<sub>2</sub> hydrate phase equilibria
under diverse, heterogeneous conditions, to provide basic knowledge
for successful ocean CO<sub>2</sub> sequestration in offshore marine
sediments. We investigated the effect of geochemical factors on CO<sub>2</sub> hydrate phase equilibrium. The three-phase (liquid–hydrate–vapor)
equilibrium of CO<sub>2</sub> hydrate in the presence of (i) organic
matter (glycine, glucose, and urea), (ii) phyllosilicates [illite,
kaolinite, and Na-montmorillonite (Na-MMT)], and (iii) mixtures of
them was measured in the ranges of 274.5–277.0 K and 14–22
bar. Organic matter inhibited the phase equilibrium of CO<sub>2</sub> hydrate by association with water molecules. The inhibition effect
decreased in the order: urea < glycine < glucose. Illite and
kaolinite (unexpandable clays) barely affected the CO<sub>2</sub> hydrate
phase equilibrium, while Na-MMT (expandable clay) affected the phase
equilibrium because of its interlayer cations. The CO<sub>2</sub> hydrate
equilibrium conditions, in the illite and kaolinite suspensions with
organic matter, were very similar to those in the aqueous organic
matter solutions. However, the equilibrium condition in the Na-MMT
suspension with organic matter changed because of reduction of its
inhibition effect by intercalated organic matter associated with cations
in the Na-MMT interlayer
Comparison of the Atomic Layer Deposition of Tantalum Oxide Thin Films Using Ta(N<sup><i>t</i></sup>Bu)(NEt<sub>2</sub>)<sub>3</sub>, Ta(N<sup><i>t</i></sup>Bu)(NEt<sub>2</sub>)<sub>2</sub>Cp, and H<sub>2</sub>O
The growth characteristics
of Ta<sub>2</sub>O<sub>5</sub> thin films by atomic layer deposition
(ALD) were examined using TaÂ(N<sup><i>t</i></sup>Bu)Â(NEt<sub>2</sub>)<sub>3</sub> (TBTDET) and TaÂ(N<sup><i>t</i></sup>Bu)Â(NEt<sub>2</sub>)<sub>2</sub>Cp (TBDETCp) as Ta-precursors, where <sup><i>t</i></sup>Bu, Et, and Cp represent <i>tert</i>-butyl, ethyl, and cyclopentadienyl groups, respectively, along with
water vapor as oxygen source. The grown Ta<sub>2</sub>O<sub>5</sub> films were amorphous with very smooth surface morphology for both
the Ta-precursors. The saturated ALD growth rates of Ta<sub>2</sub>O<sub>5</sub> films were 0.77 Å cycle<sup>–1</sup> at
250 °C and 0.67 Å cycle<sup>–1</sup> at 300 °C
using TBTDET and TBDETCp precursors, respectively. The thermal decomposition
of the amido ligand (NEt<sub>2</sub>) limited the ALD process temperature
below 275 °C for TBTDET precursor. However, the ALD temperature
window could be extended up to 325 °C due to a strong Ta–Cp
bond for the TBDETCp precursor. Because of the improved thermal stability
of TBDETCp precursor, excellent nonuniformity of ∼2% in 200
mm wafer could be achieved with a step coverage of ∼90% in
a deep hole structure (aspect ratio 5:1) which is promising for 3-dimensional
architecture to form high density memories. Nonetheless, a rather
high concentration (∼7 at. %) of carbon impurities was incorporated
into the Ta<sub>2</sub>O<sub>5</sub> film using TBDETCp, which was
possibly due to readsorption of dissociated ligands as small organic
molecules in the growth of Ta<sub>2</sub>O<sub>5</sub> film by ALD.
Despite the presence of high carbon concentration which might be an
origin of large leakage current under electric fields, the Ta<sub>2</sub>O<sub>5</sub> film using TBDETCp showed a promising resistive
switching performance with an endurance cycle as high as ∼17 500
for resistance switching random access memory application. The optical
refractive index of the deposited Ta<sub>2</sub>O<sub>5</sub> films
was 2.1–2.2 at 632.8 nm using both the Ta-precursors, and indirect
optical band gap was estimated to be ∼4.1 eV for both the cases