60 research outputs found

    Effect of Growth Temperature on Bamboo-shaped Carbon–Nitrogen (C–N) Nanotubes Synthesized Using Ferrocene Acetonitrile Precursor

    Get PDF
    This investigation deals with the effect of growth temperature on the microstructure, nitrogen content, and crystallinity of C–N nanotubes. The X-ray photoelectron spectroscopic (XPS) study reveals that the atomic percentage of nitrogen content in nanotubes decreases with an increase in growth temperature. Transmission electron microscopic investigations indicate that the bamboo compartment distance increases with an increase in growth temperature. The diameter of the nanotubes also increases with increasing growth temperature. Raman modes sharpen while the normalized intensity of the defect mode decreases almost linearly with increasing growth temperature. These changes are attributed to the reduction of defect concentration due to an increase in crystal planar domain sizes in graphite sheets with increasing temperature. Both XPS and Raman spectral observations indicate that the C–N nanotubes grown at lower temperatures possess higher degree of disorder and higher N incorporation

    New insights into CoFe/n-Si interfacial structure as probed by X-ray photoelectron spectroscopy

    Get PDF
    X-ray photoelectron spectroscopy (XPS) is a well known tool in studying the physical and chemical properties of surface/interfaces which provides the element specific, non-destructive and quantitative information. In the present study, information about the surface chemical states of interfacial structure of CoFe thin films on n-Si substrates has been studied from XPS technique. The surface of the samples has also been cleaned from ion beam etching for 30 min with Ar+ ions to record the XPS spectra. The observation shows that the Si atoms are present within the probed surface layer due to interfacial intermixing across the interface which is due to strong chemical reactivity of n-Si substrate. A shift in the binding energy peaks of Fe2p and Co2p has also been observed which could be due to the formation of silicide phases as a result of interfacial intermixing. XPS results have indicated the formation of silicide phases across the interfaces which poses interfacial antiferromagnetic coupling across CoFe/n-Si interface to affect the magnetic behaviour. It has been found that the present XPS results are in well support with our earlier study

    Synthesis and Characterization of Cds Nanocrystallites Dispersed in Polymer Matrix

    No full text
    Cadmium sulphide (CdS) nanocrystallites were prepared by sulphuration route with capping in polyethylene oxide (PEO) polymer matrix. It is found that PEO could provide a confined environment for particle nucleation and growth of CdS nanocrystallites. The scanning electron microscopy (SEM) with energy dispersive analysis by X-ray (EDAX) studies confirms the presence of CdS nanocrystallites in polymer matrix. X-ray diffraction (XRD) studies and transmission electron microscopy (TEM) selected area diffraction (SAD) patterns show that these crystallites have hexagonal structure. The TEM and UV-Visible absorption studies indicate uniform size distribution having size around 2.3 nm and band gap of 2.7 eV. X-ray photoelectron spectroscopy (XPS) studies reveal that core level energy positions of the Cd is shifted towards the lower binding energy and has similar chemical environment to that of bulk CdS

    Modulus Spectroscopy and Dielectric Dispersion Studies in Alkali Metal Perchlorates

    No full text
    Alkali metal perchlorates (KClO4, RbClO4, and CsClO4) undergo a structural phase transition from the orthorhombic to the cubic phase at elevated temperatures. A detailed dielectric study of these crystals across the phase transition is carried out at different frequencies. The crystals are found to exhibit pronounced dielectric dispersion in the kHz frequency range. The results support the view that these transitions are of order–disorder type. The dielectric behaviour at temperatures above Tc is discussed in terms of modulus spectroscopy. An estimate of conductivity relaxation times above the phase transition temperatures made from modulus spectroscopy data gives values of 3.1, 12.2 and 17.7 μs for KClO4, RbClO4, and CsClO4, respectively
    corecore