2 research outputs found
Work-Function Engineering of Graphene Electrodes by Self-Assembled Monolayers for High-Performance Organic Field-Effect Transistors
We have devised a method to optimize the performance of organic field-effect transistors (OFETs) by controlling the work functions of graphene electrodes by functionalizing the surface of SiO<sub>2</sub> substrates with self-assembled monolayers (SAMs). The electron-donating NH<sub>2</sub>-terminated SAMs induce strong n-doping in graphene, whereas the CH<sub>3</sub>-terminated SAMs neutralize the p-doping induced by SiO<sub>2</sub> substrates, resulting in considerable changes in the work functions of graphene electrodes. This approach was successfully utilized to optimize electrical properties of graphene field-effect transistors and organic electronic devices using graphene electrodes. Considering the patternability and robustness of SAMs, this method would find numerous applications in graphene-based organic electronics and optoelectronic devices such as organic light-emitting diodes and organic photovoltaic devices
Photoelectric Memory Effect in Graphene Heterostructure Field-Effect Transistors Based on Dual Dielectrics
We
report a photo and field (PF)-induced doping of a graphene-heterostructure
field-effect transistor (graphene HFET) using a double-layered gate
insulator consisting of narrow-bandgap insulator (NGI) and wide-bandgap
insulator (WGI). The PF-induced doping in the graphene HFETs with
variable NGIs (hafnium oxide, silicon nitride, and hexagonal boron
nitride) are investigated, and consequently we reveal that this rewritable/erasable
doping behavior is not limited to specific insulating materials, but
unexceptionally accomplished when a step-like vertical band diagram,
that is graphene/NGI/WGI, is fulfilled in the device. We clearly
verify that this doping is originated from PF-induced charge transfer
between graphene and defects at the NGI/WGI interface, and then the
polarized charges at the NGI/WGI interface pretend to be “remote
dopants”, shifting Dirac voltage of the device. The remote
dopant is highly stable in the dark due to the presence of the adjacent
insulators providing enormous energy barriers, but can be efficiently
tuned by the modulation of the gate bias and incident photon energy. Because
the PF-induced doping mechanism is not limited by specific materials
that is still hard to be synthesized as a large scale, the graphene
HFET memory devices can be patterned with a large scale using practical
fabrication processes, appealing to industrial applications