Iddq testing of a CMOS 10-bit charge scaling digital-to-analog converter

This work presents an effective built-in current sensor (BICS), which has a very small impact on the performance of the circuit under test (CUT). The proposed BICS works in two-modes the normal mode and the test mode. In the normal mode the BICS is isolated from the CUT due to which there is no performance degradation of the CUT. In the testing mode, our BICS detects the abnormal current caused by permanent manufacturing defects. Further more our BICS can also distinguish the type of defect induced (Gate-source short, source-drain short and drain-gate short). Our BICS requires neither an external voltage source nor current source. Hence the BICS requires less area and is more efficient than the conventional current sensors. The circuit under test is a 10-bit digital to analog converter using charge-scaling architecture

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I would like to dedicate my work to my parents, Mr. and Mrs. A.Sreedhar Rao and my brother Seshu, for their constant prayers and encouragement throughout my life. I am very grateful to my advisor Dr. A. Srivastava for his guidance, patience and understanding throughout this work. His suggestions, discussions and constant encouragement have helped me to get a deep insight in the field of VLSI design. my committee. I would like to thank Dr. P. K. Ajmera and Dr. Martin Feldman for being a part of I am very thankful to Electrical Engineering Department, for supporting me financially during my stay at LSU. I would like to thank my friend Miss. Chandra Srinivasan for her constant love and support for me through out my life. I take this opportunity to thank my friends Anand, Uday, Vijay and Harish for their help and encouragement at times I needed them. I would also like to thank all my friends here who made my stay at LSU an enjoyable and a memorable one. Last of all I thank GOD for keeping me in good health and spirits throughou