6 research outputs found
A new adaptive multi-biasS-parameter measurement algorithm for transistor characterization
- Author
- Publication venue
- 'Wiley'
- Publication date
- 01/01/2005
- Field of study
Review of shelf life evaluation methods and a physics of failure approach for shelf life estimation for electronic components
- Author
- Association Connecting Electronics Industries (IPC)
- Casasnovas
- Diganta Das
- EIAJ ED04701/300-1
- Electric Power Research Institute (EPRI)
- EPCOS
- Fujitsu Semiconductor Europe
- Galloway
- Gasperi
- International Electrotechincal Commission (IEC)
- Kitano
- Kulkarni
- Lee
- Li
- Li
- Madsen
- Manoharan
- Manoharan
- Manoharan
- Manoharan
- Manoharan
- Manoharan
- McCluskey
- McCluskey
- Nga Man Jennifa Li
- NXP
- Osterman
- Park
- Patel
- Patrick McCluskey
- Polcano
- Pope
- Shyamsundar
- Society of Automotive Engineers (SAE)
- Society of Automotive Engineers (SAE)
- Society of Automotive Engineers (SAE)
- Society of Automotive Engineers (SAE)
- Solid State Technology Association (JEDEC)
- Solid State Technology Association (JEDEC)/Association Connecting Electronics Industries (IPC)
- Song
- Sorensen
- Stevens
- Texas Instrument
- U.S Department of Defense
- Wang
- Weast
- Zhang
- Zhang
- Zhao
- Publication venue
- 'Elsevier BV'
- Publication date
- Field of study
A Practical Approach to Verification of Floating-Point C/C++ Programs with math.h/cmath Functions
- Author
- Aho A. V.
- Bagnara R.
- Bagnara R.
- Barr E. T.
- Belaid M. S.
- Benhamou F.
- Borges M.
- Botella B.
- Brain Martin
- Burdy L.
- Cadar C.
- Coen-Porisini A.
- Cousot P.
- Cousot P.
- Darulova E.
- Darulova E.
- Daumas M.
- Denmat T.
- Franco A. Di
- Fu Z.
- Godefroid P.
- Godefroid P.
- Gotlieb A.
- Gotlieb A.
- Goubault E.
- Goubault E.
- Harrison J.
- Hentenryck P. Van
- Hills Green
- Hills Green
- IEEE Computer Society
- IEEE Computer Society and The Open Group. 2013.
- International Organization for Standardization. 2011. ISO/IEC 9899:2011
- International Organization for Standardization. 2014. ISO/IEC 14882:2014(E)
- Lakhotia K.
- Lakhotia K.
- Lee W.
- Liew D.
- Magron V.
- Michel C.
- Miné A.
- Monniaux D.
- Moscato M.
- Muller J.-M.
- Semiconductor Fujitsu
- Sen K.
- Solovyev A.
- Stephens N.
- Wu X.
- Wu X.
- Young W. D.
- Publication venue
- 'Association for Computing Machinery (ACM)'
- Publication date
- Field of study
Battery-Free Game Boy
- Author
- Ahmed Saad
- Alharthi Sultan A.
- Ambiq Micro Inc. 2018.
- Arreola Alberto Rodriguez
- Bandai Corporation
- Barathi Soumya C.
- Becker Uwe
- Chandrasekhar Arunkumar
- Chandrasekhar Arunkumar
- Channel Low
- Copetti Rodrigo
- Corp
- Der Woude Joel Van
- Dierk Christine
- Environment German Federal
- Floyd' Mueller Florian
- Gordon Lewis
- Green Electronics Council
- Gulati Manoj
- Hessar Mehrdad
- Hester Josiah
- Hester Josiah
- Hester Josiah
- Hester Josiah
- Huber Nick
- Ioannou Christos
- Iyer Vikram
- Japan Display Inc. 2016. LPM013M126A 1.28" MIP Reflective Color LTPS TFT LCD.
- Jayatilaka Asangi
- Kenwright Ben
- Lam Andre
- Lee Seulki
- Li Tianxing
- Li Zhuying
- Ltd Fujitsu Semiconductor
- Lucia Brandon
- Ma Dong
- Maeng Kiwan
- Maeng Kiwan
- Merrett Geoff V.
- Mills Evan
- Naderiparizi Saman
- Naderiparizi Saman
- Naderiparizi Saman
- Nakamura Yuji
- Nintendo Co.
- Nintendo Co.
- Panic Inc. 2020.
- Parks Aaron N.
- Prasad R. Venkatesha
- Projekt CD
- Saffari Ali
- Sasatani Takuya
- Schiesel Seth
- Schreier Jason
- Semiconductor Components
- Sparks Philip
- Sumiya Kazunobu
- Taylor Haydn
- Texas Instruments Inc. 2013.
- Texas Instruments Inc. 2016. TPS61099 0.7 Vin Synchronous Boost Converter with 800 nA Ultra-Low Quiescent Current.
- Tom Zeller Jr.
- UNI-T.
- Unit Economist Intelligence
- United Nations Environment Programme. 2020.
- University of Michigan MI, USA. 2011.
- University of Washington Seattle, WA, USA. 2010.
- Valve Inc. 2020.
- Varga Virag
- Varga Virag
- Wang Jingxian
- Works Panasonic Electric
- Yıldırım Kasım Sinan
- Zhang Chi
- Zhao Chen
- Publication venue
- 'Association for Computing Machinery (ACM)'
- Publication date
- Field of study