Entropy as a Measure of Quality of XML Schema Document

In this paper, a metric for the assessment of the structural complexity of eXtensible Markup Language schema document is formulated. The present metric ‘Schema Entropy is based on entropy concept and intended to measure the complexity of the schema documents written in W3C XML Schema Language due to diversity in the structures of its elements. The SE is useful in evaluating the efficiency of the design of Schemas. A good design reduces the maintainability efforts. Therefore, our metric provides valuable information about the reliability and maintainability of systems. In this respect, this metric is believed to be a valuable contribution for improving the quality of XML-based systems. It is demonstrated with examples and validated empirically through actual test cases

Measuring and Evaluating a Design Complexity Metric for XML Schema Documents

The eXtensible Markup Language (XML) has been gaining extraordinary acceptance from many diverse enterprise software companies for their object repositories, data interchange, and development tools. Further, many different domains, organizations and content providers have been publishing and exchanging information via internet by the usage of XML and standard schemas. Efficient implementation of XML in these domains requires well designed XML schemas. In this point of view, design of XML schemas plays an extremely important role in software development process and needs to be quantified for ease of maintainability. In this paper, an attempt has been made to evaluate the quality of XML schema documents (XSD) written in W3C XML Schema language. We propose a metric, which measures the complexity due to the internal architecture of XSD components, and due to recursion. This is the single metric, which cover all major factors responsible for complexity of XSD. The metric has been empirically and theoretically validated, demonstrated with examples and supported by comparison with other well known structure metrics applied on XML schema documents

Document Type De�nition (DTD) Metrics

In this paper, we present two complexity metrics for the assessment of schema quality written in Document Type De�finition (DTD) language. Both "Entropy (E) metric: E(DTD)" and "Distinct Structured Element Repetition Scale (DSERS) metric: DSERS(DTD)" are intended to measure the structural complexity of schemas in DTD language. These metrics exploit a directed graph representation of schema document and consider the complexity of schema due to its similar structured elements and the occurrences of these elements. The empirical and theoretical validations of these metrics prove the robustness of the metrics

Reversing the Stein Effect

The Reverse Stein Effect is identified and illustrated: A statistician who shrinks his/her data toward a point chosen without reliable knowledge about the underlying value of the parameter to be estimated but based instead upon the observed data will not be protected by the minimax property of shrinkage estimators such as that of James and Stein, but instead will likely incur a greater error than if shrinkage were not used.Comment: Published in at http://dx.doi.org/10.1214/09-STS278 the Statistical Science (http://www.imstat.org/sts/) by the Institute of Mathematical Statistics (http://www.imstat.org