7 research outputs found
Reducing the cooling energy consumption of telecom sites by liquid cooling
Abstract
The use of mobile data has increased and will continue to increase in the future, because more data is moving to wireless networks such as 5G. Cooling energy need is also expected to increase in indoor telecom rooms, and can be as high as the equipment’s own power consumption. The world’s first liquid Base Transceiver Station (BTS) was adopted into commercial use in 2018, in Helsinki, Finland. Conventional air-cooled BTS hardware was converted into liquid-cooled BTS equipment. Heat from the BTS was pumped out of the site room, and thus ventilation or air conditioning was not needed for the heat load from the BTS. Heat stored in the liquid was released into the ventilation duct of the building, still providing annual cooling energy savings of 70%, when compared to air cooling. In the future, 80% of the total dissipated energy, 13450 kWh/a in total, can potentially be used for heating purposes. In terms of CO₂ emissions, adapting liquid cooling showed an 80% reduction potential when compared to air cooling
BGA interconnection reliability in mirrored module configurations
Abstract
Interconnection dimensions are becoming more important due to electrical signal timing requirements and stray effects, such as unwanted inductance, leading to increasingly denser packaging. One way to shorten the signal path is to use mirrored structures, where the components are placed on opposite sides of the printed circuit board (PCB). This paper presents thermal cycling test (TCT) results in a temperature interval from -40 °C to +125 °C and simulation results of plastic ball grid array components mounted on one side [single side (SS) configuration] and in different mirrored configurations on a PCB. Anand’s constitutive model is used in the finite-element analysis software to calculate dissipated creep energy densities in the interconnections. Field lifetimes of the presented cases were also calculated on the basis of the dissipated creep energy densities and TCT data. In addition, supporting microscopic studies were done. The single-sided configuration had a longer lifetime than the mirrored configurations with components on opposite sides. The mirrored configurations had adverse simulated creep energies and TCT lifetimes, compared with the single-sided configuration. The simulations proved that the flexibility of the mirrored structures was hindered, thus increasing stress levels in critical interconnections
Base station energy use in dense urban and suburban areas
Abstract
Growing energy consumption is a global problem. The information and communications technology (ICT) industry is in a critical role as an enabler of energy savings in other sectors. However, the power consumption of the ICT sector also needs to be addressed, to contribute to the overall reduction of power consumption and carbon emissions. A new era has begun as the fifth generation (5G) mobile data connection rollouts are advancing globally and are expected to reach a 10% share of end-user devices and connections by 2023. The available references on energy consumption in global mobile networks are rather old and highly averaged — only estimates of energy consumption relative to data volumes are available. There is an information gap regarding the energy consumption of emerging 5G and advanced 4G technologies. Therefore, it has been difficult to understand the actual electricity consumption differences between generations and spatially aggregated electricity consumption once these generations are combined to offer capacity and coverage. This article fills this gap by providing a reference on the energy consumption of base transceiver stations for reported mobile data usage for different Radio Access Technologies; 3G, 4G and 5G respectively. To the best of our knowledge, there is no reference to scientific research on the comparison of energy intensity per square kilometer for 3G, 4G and 5G mobile radio technologies, using actual operator data. The objective of this research was to improve the understanding of the actual energy consumption of different Radio Access Technologies (RAT). The results also give insight to decision makers on when to modernize the operator radio access network. The article reports on the results of field measurements on data and visitor volumes and shares of different RATs. The research contains two statistical RAT combination cases, one representing the European average and the other Finnish mobile networks. The analyses were done for dense urban (DU) and suburban (SU) areas
Effect of voids on thermomechanical cracking in lead-free Sn3Ag0.5Cu interconnections of power modules
Abstract
In this article, the effect of voids on thermomechanically-induced failure in the lead-free solder interconnections of power amplifier (PA) modules is investigated. The interconnection of interest is between the module’s flange and substrate (baseplate) initially having a large contact area, and whose cracking has strong detrimental effects on the RF performance and reliability of the PA. PA modules were attached onto baseplates with lead-free SAC305 solder and put to a thermal cycling test (TCT) in the 15 °C to 95 °C range. X-ray imaging was used to characterize the number of voids in interconnections after reflow soldering. The cross-sections of the pristine reflow-soldered and tested interconnections were inspected with cross-polarized light microscopy to reveal the shapes of the voids and crack paths. It was noted that the voids forming in interconnections during the final stages of the reflow process take an elliptical shape, leaning towards the module’s outer edge, due to differences in the thermal expansions of the module and baseplate. During the TCT, high thermomechanical stresses caused localized recrystallization of the as-soldered SAC matrix in the vicinity of the elliptical voids. Finally, creep related intergranular cracks formed in these recrystallized areas. Anand’s viscoplastic model was used to model the void formation and the effect of the formed voids on crack evolution in solder. Simulations of the high creep energy of the elliptical, tilted voids and their correlation with the recrystallization behavior of the SAC305 interconnections were consistent with the observed creep related failures. Confirmed by simulations, these voids are detrimental to the reliability of solder interconnection because the creep strain is strongly localized to the sharp curvatures of the elliptic void
Power module interconnection reliability in BTS applications
Abstract
In this paper, the reliability of RF power transistors’ solder attachments is characterized through experiments and simulations. Test cases consisted of power amplifier (PA) modules on AlSi10Mg substrates with either a low or high mutual thermal mismatch. The module’s flange interconnections were stressed by means of thermal cycling testing (TCT) in the 15 °C–95 °C range. Scanning acoustic microscopy (SAM) was used intermittently to inspect the interconnections of selected structures during cycling breaks. Optical cross-polarization microscopy and scanning electron microscopy were used in the failure analysis of the solder joints. Different materials and dimensional variations were tested in simulations to observe differences in thermal stress. The viscoplastic behavior of lead-free solder in the interconnection was modeled using Anand’s constitutive equations. The first cracks could be observed with SAM after 100 cycles. SAM imaging showed that in the worst case, 72% of the interconnection area had cracked at the end of the 1100-cycle TCT. Only a marginal amount of cracks could be observed in PA modules with a better coefficients of thermal expansion match to the substrate. Simulations indicated that it is possible to decrease creep energies significantly and thereby increase the lifetime expectancy of interconnections by selecting the correct materials and structures