Inner shell ionization of argon in ECRIS plasma

The volumetric emission rate of argon emitted from the electron cyclotron resonance (ECR) heated plasmas of the JYFL (University of Jyväskylä, Department of Physics) 14 GHz ECR ion source (ECRIS) and the 14.5 GHz Grenoble Test Source (GTS) at iThemba Laboratory for Accelerator Based Sciences have been measured to gain an understanding of the influence of the ion source tune parameters on the absolute inner shell ionization rate. It was observed that the behaviour of the ionization rate and the extracted ion beam currents react differently, depending the parametric sweep performed. The neutral gas pressure and incident microwave power was found to have the strongest influence on the ionization rate. At high neutral gas pressure, the absolute inner shell ionization rate was found to saturate. This observation is as a result of the plasma energy content becoming insufficient to sustain the growth in ionization rate. It was also observed that the incident microwave power should be increased much more to counter the decrease in high charge state production as a result of the gas increase and subsequent increase in charge exchange. At low incident microwave, the ionization rate per unit absorbed microwave power was found to be high, which suggests that the inner shell ionization process is driven by the ion dynamics as opposed to the electron dynamics. The influence of the biased disc voltage and magnetic field configuration on the ionization rate was found to be minimal. This led to the suggestion that these two tune parameters does not directly impact the warm electron population of the ECRIS plasma during the parametric sweeps. The emission rate can be used as an additional tool for benchmarking the results of numerical simulation codes on ECRIS plasmas.peerReviewe

ECRIS plasma spectroscopy with a high resolution spectrometer

Electron Cyclotron Resonance Ion Source (ECRIS) plasmas contain high-energy electrons and highly charged ions implying that only noninvasive methods such as optical emission spectroscopy are reliable in their characterization. A high-resolution spectrometer (10 pm FWHM at 632 nm) enabling the detection of weak emission lines has been developed at University of Jyväskylä, Department of Physics (JYFL) for this purpose. Diagnostics results probing the densities of ions, neutral atoms, and the temperature of the cold electron population in the JYFL 14 GHz ECRIS are described. For example, it has been observed that the cold electron temperature drops from 40 eV to 20 eV when the extraction voltage of the ion source is switched off, accompanied by two orders of magnitude decrease in Ar9+ optical emission intensity, suggesting that diagnostics results of ECRIS plasmas obtained without the extraction voltage are not depicting the plasma conditions of normal ECRIS operation. The relative changes of the plasma optical emission and the ion beam current have been measured in CW and amplitude modulation operation mode of microwave injection. It is concluded that in the CW mode, the ion currents could be limited by diffusion transport and electrostatic confinement of the ions rather than beam formation in the extraction region and subsequent transport. The high resolution of the spectrometer allows determining the ion temperature by measuring the Doppler broadening of the emission lines and subtracting the wavelength dependent instrumental broadening. The measured ion temperatures in the JYFL 14 GHz ECRIS are between 5 and 28 eV, depending on the plasma species and charge state. Gas mixing is shown to be an effective method to decrease the ion temperature of high charge state argon ions from 20 eV in pure argon discharge to 5 eV when mixed with oxygen. I. INTRpeerReviewe

Experimental evidence on microwave induced electron losses from ECRIS plasma

The balance between warm and hot (>1 keV) electron density and their losses from the magnetic confinement system of an Electron Cyclotron Resonance Ion Source (ECRIS) plasma is considered to be one of the main factors determining the rate of the high charge state ion production. One of the key loss channels for heated electrons is thought to be induced by the injected microwaves. While this loss mechanism, referred to as rf-induced pitch angle scattering, has been studied theoretically and with computational tools, direct experimental evidence of its significance in minimum-B ECRIS plasmas remains limited. In this work, experimental evidence of microwave induced electron losses in the axial direction is presented in both continuous wave (CW) and pulsed operation of a 14 GHz ECRIS. In the CW mode, the experiment was carried out by comparing the characteristic X-ray emission from the plasma volume and from the surface of the biased disc located in the flux of the escaping electron at the axial magnetic mirror. Parametric sweeps of magnetic field, neutral gas pressure, and microwave power were conducted to determine their effect on electron losses. In the pulsed mode, the experiment was conducted by measuring the flux of escaping electrons through aluminum foils of different thicknesses providing some energy resolution. Both diagnostics support the view that rf-induced losses account for up to 70% of total hot electron losses and their importance depends on the source parameters, especially power and neutral gas pressure.peerReviewe

The effect of microwave power on the Ar9+ and Ar13+ optical emission intensities and ion beam currents in ECRIS

The production of Ar9+ and Ar13+ ions in an ECRIS plasma and the efficiency of the ion beam extraction and transport of the resulting Ar9+ and Ar13+ ion beams have been studied with the JYFL 14 GHz ECRIS by using optical emission spectroscopy and measurement of the m/q analyzed beam currents. The relative changes in both the optical emission and the ion beam current in CW mode as function of microwave power and in amplitude modulation (AM) operation mode are reported. The results indicate a discrepancy between the parametric dependence of high charge state ion densities in the core plasma and their extracted beam currents. The observation implies that in CW mode the ion currents could be limited by diffusion transport and electrostatic confinement of the ions rather than beam formation in the extraction region and subsequent transport.peerReviewe

Plasma diagnostic tools for ECR ion sources : What can we learn from these experiments for the next generation sources

The order-of-magnitude performance leaps of ECR ion sources over the past decades result from improvements to the magnetic plasma confinement, increases in the microwave heating frequency, and techniques to stabilize the plasma at high densities. Parallel to the technical development of the ion sources themselves, significant effort has been directed into the development of their plasma diagnostic tools. We review the recent results of Electron Cyclotron Resonance Ion Source (ECRIS) plasma diagnostics highlighting a number of selected examples of plasma density, electron energy distribution, and ion confinement time measurements, obtained mostly with the second-generation sources operating at frequencies from 10 to 18 GHz. The development of minimum-B ECR ion sources based on the superposition of solenoid and sextupole fields has long relied on semiempirical scaling laws for the strength of the magnetic field with increasing plasma heating frequency. This approach is becoming increasingly difficult with the looming limits of superconducting technologies being able to satisfy the magnetic field requirements at frequencies approaching 60 GHz. Thus, we discuss alternative ECRIS concepts and proposed modifications to existing sources that are supported by the current understanding derived from the plasma diagnostics experiments.peerReviewe