23 research outputs found

    Broadband omnidirectional antireflection coating based on subwavelength surface Mie resonators

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    Reflection is a natural phenomenon that occurs when light passes the interface between materials with different refractive index. In many applications, such as solar cells or photodetectors, reflection is an unwanted loss process. Many ways to reduce reflection from a substrate have been investigated so far, including dielectric interference coatings, surface texturing, adiabatic index matching and scattering from plasmonic nanoparticles. Here we present an entirely new concept that suppresses the reflection of light from a silicon surface over a broad spectral range. A two-dimensional periodic array of subwavelength silicon nanocylinders designed to possess strongly substrate-coupled Mie resonances yields almost zero total reflectance over the entire spectral range from the ultraviolet to the near-infrared. This new antireflection concept relies on the strong forward scattering that occurs when a scattering structure is placed in close proximity to a high-index substrate with a high optical density of states

    Development and Psychometric Properties of a New Questionnaire to Assess Mental Health and Concerning Behaviors in Children and Young People with Autism Spectrum Disorder (ASD):The Assessment of Concerning Behavior (ACB) Scale

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    Although 70% of autistic children and young people meet criteria for co-occurring psychiatric conditions, there are few screening measures specifically for autistic individuals. We describe the development and validation of the Assessment of Concerning Behavior (ACB), an instrument co-developed with the autistic community to assess mental health and problematic/risky behaviors. Items include descriptions to facilitate symptom recognition by autistic people, and carers/professionals. The ACB was completed by 255 parents, 149 autistic children and young people and 30 teachers. Internal consistency, stability and validity was assessed. The ACB parent-version fit a two-factor model (internalizing and externalizing problems) and showed adequate test–retest reliability, internal consistency and construct validity. The ACB is a promising new measure for research and clinical use in autism

    Solution-processed semiconductors for next-generation photodetectors

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    Efficient light detection is central to modern science and technology.Current photodetectors mainly use photodiodes based on crystalline inorganic elementalsemiconductors, such as silicon, or compounds such as III–V semiconductors. Photodetectorsmade of solution-processed semiconductors — which include organic materials, metal-halideperovskites and quantum dots — have recently emerged as candidates for next-generation lightsensing. They combine ease of processing, tailorable optoelectronic properties, facile integrationwith complementary metal–oxide–semiconductors, compatibility with flexible substrates andgood performance. Here, we review the recent advances and the open challenges in the field ofsolution-processed photodetectors, examining the topic from both the materials and the deviceperspective and highlighting the potential of the synergistic combination of materials and deviceengineering. We explore hybrid phototransistorsand their potential to overcome trade-offsin noise, gain and speed, as well as the rapid advances in metal-halide perovskite photodiodesand their recent application in narrowband filterless photodetection
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