9 research outputs found
Electric and dielectric parameters in Au/n-Si (MS) capacitors with metal oxide-polymer interlayer as function of frequency and voltage
Investigation of the efficiencies of the (SnO2-PVA) interlayer in Au/n-Si (MS) SDs on electrical characteristics at room temperature by comparison
Current-Transport Mechanisms of the Al/(Bi2S3-PVA Nanocomposite)/p-Si Schottky Diodes in the Temperature Range Between 220 K and 380 K
Integration of ferroelectric BIT and dielectric HfO2 on silicon substrate with high data retention and endurance for ferroelectric FET applications
An evaluation of structural, optical and electrical characteristics of Ag/ZnO rods/SnO2/In–Ga Schottky diode
Effectuality of Barrier Height Inhomogeneity on the Current–Voltage–Temperature Characteristics of Metal Semiconductor Structures with CdZnO Interlayer
Electric and Dielectric Properties of Au/ZnS-PVA/n-Si (MPS) Structures in the Frequency Range of 10-200 kHz
WOS: 000403016800064Pure polyvinyl alcohol (PVA) capped ZnS semiconductor nanocrystals were prepared by microwave-assisted method, and the optical and structural properties of the as-prepared materials were characterized by x-ray diffraction (XRD) and Ultraviolet-visible (UV-Vis) techniques. The XRD pattern shows the formation of ZnS nanocrystals, and the UV-Vis spectroscopy results show a blue shift of about 1.2 eV in its band gap due to the confinement of very small nanostructures. The concentration of donor atoms (N (D)), diffusion potential (V (D)), Fermi energy level (E (F)), and barrier height (I broken vertical bar(B) (C-V)) values were obtained from the reverse bias C (-2)-V plots for each frequency. The voltage dependent profile of series resistance (R (s)) and surface states (N (ss)) were also obtained using admittance and low-high frequency methods, respectively. R (s)-V and N (ss)-V plots both have distinctive peaks in the depletion region due to the spatial distribution charge at the surface states. The effect of R (s) and interfacial layer on the C-V and G/omega-V characteristics was found remarkable at high frequencies. Therefore, the high frequency C-V and G/omega-V plots were corrected to eliminate the effect of R (s). The real and imaginary parts of dielectric constant (epsilon' and epsilon aEuro(3)) and electric modulus (M' and MaEuro(3)), loss tangent (tan delta), and ac electrical conductivity (sigma (ac)) were also obtained using C and G/omega data and it was found that these parameters are indeed strong functions of frequency and applied bias voltage. Experimental results confirmed that the N (ss), R (s) , and interfacial layer of the MPS structure are important parameters that strongly influence both the electrical and dielectric properties. The low values of N (ss) (similar to 10(9) eV(-1) cm(-2)) and the value of dielectric constant (epsilon' = 1.3) of ZnS-PVA interfacial layer even at 10 kHz are very suitable for electronic devices when compared with the SiO2. These results confirmed that the ZnS-PVA considerably improves the performance of Au/n-Si (MS) structure and also allow it to work as a capacitor, which stores electric charges or energy