The energy calibration of x‐ray absorption spectra using multiple‐beam diffraction

A new method for calibrating the energy scale of x‐ray absorption spectra from an energy dispersive spectrometer has been developed. Distinct features in the diffracted intensity of the curved silicon crystal monochromator have been assigned to multiple‐beam diffraction. The photon energies of these structures can be calculated if the precise spacing of the diffracting planes and the orientation of the crystal relative to the incident synchrotron radiation are known. The evaluation of Miller indices of operative reflections and the calculation of the corresponding photon energy is presented. The assignment of operative reflexes is simplified if the monochromator crystal can be rotated around the main diffracting vector H

X-ray absolute intensity measurement at HASYLAB ultrasmall angle x-ray scattering beamline BW4

In order to obtain small angle scattering intensities in absolute units, measurements of the incident beam intensity and the intensity transmitted through the sample are required. For this purpose the scattering intensity of a calibrated polyethylene (LUPOLEN) standard is used. For the determination of the absolute photon flux and the correction of the scattering patterns obtained with a two dimensional position sensitive detector we use the detector response function. A set of data measured subsequently at the standard and at a given sample can be evaluated in a program that calculates a pattern in absolute units corrected by means of the detector response. This program also calculates the absolute photon flux, determines automatically the center coordinates of the incident beam, and calculates the scattering vectors that belong to the different positions on the detector