Study Regarding Gravimetrical Corrosion of the Superficial Layers Obtained through Electrical Discharge

The experimental research was made on superficial layers laid-down through electrical sparking on the steel carbon OLC 45 probes, the used electrode being made from a corrosion resistant material (Copper). The probes was immersed 285 days in static see water at the environments temperature. The corrosion speed was determined through gravimetrical method; the superficial layers subjected to the corrosive agent were analyzed by optical metallographic and atomic force microscopy

Ultrathin Films of Silver by Magnetron Sputtering

The interest in ultrathin silver (Ag) films has increased due to their high surface plasmon resonance for coatings of only a few nm. Low roughness ultrathin films of 1 to 9 nm have been deposited on different substrates, such as polyethylene terephthalate (PET) and optical glass, using radio frequency (RF) magnetron sputtering. Films show good surface plasmon resonance up to 7 nm thickness, as revealed by the ultraviolet-visible (UV-Vis) spectra. The roughness of the films, investigated by Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM), is small, and one can conclude that depositions are smooth and homogeneous. The bandgap values decrease with film thickness. The refractive index of the films, calculated from ellipsometry measurements, leads to values of under 1 visible domain, with minima in the wavelength range of 400–600 nm. The results are useful for obtaining lower roughness ultrathin Ag films with good surface plasmon resonance for photonic applications

Ultrathin Films of Silver by Magnetron Sputtering

The interest in ultrathin silver (Ag) films has increased due to their high surface plasmon resonance for coatings of only a few nm. Low roughness ultrathin films of 1 to 9 nm have been deposited on different substrates, such as polyethylene terephthalate (PET) and optical glass, using radio frequency (RF) magnetron sputtering. Films show good surface plasmon resonance up to 7 nm thickness, as revealed by the ultraviolet-visible (UV-Vis) spectra. The roughness of the films, investigated by Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM), is small, and one can conclude that depositions are smooth and homogeneous. The bandgap values decrease with film thickness. The refractive index of the films, calculated from ellipsometry measurements, leads to values of under 1 visible domain, with minima in the wavelength range of 400–600 nm. The results are useful for obtaining lower roughness ultrathin Ag films with good surface plasmon resonance for photonic applications