High precision dynamic multi-interface profilometry with optical coherence tomography

Optical coherence tomography (OCT) has mostly been used for high speed volume imaging but its profilometry potentials have not been fully exploited. This paper demonstrates high precision (as good as ~50nm) multi-interface profilometry using a Fourier domain OCT system without special anti-vibration devices. The precision is up to two orders of magnitudes better than the depth resolution of the OCT. Detailed analysis of the precision achieved for different surfaces is presented. The multi-interface profiles are obtained as a by-product of the tomography data. OCT has advantage in speed and sensitivity at detecting rough and internal interfaces compared to conventional optical profilometry. An application of the technique to the dynamic monitoring of varnish drying on paint-like substrates is demonstrated, which provides a better understanding of the formation of surface roughness. The technique has potential benefits in the field of art conservation, coatings technology and soft matter physics