Rare association of Fahr’s disease with multiple myeloma: A case report

Fahr’s disease or Fahr’s syndrome is a rare neurological disorder characterized by abnormal calcified deposits in the basal ganglia and cerebral cortex. 47 years male who presented to us with progressive ataxia and Parkinsonian symptoms was found to have extensive bilateral calcifications including bilateral basal ganglia in CT scan of the brain. The secondary causes of intracranial calcifications were ruled out to make a clinical diagnosis of Fahr’s disease. While investigating for chronic low back pain with anemia and renal failure, high ESR and serum protein electrophoresis showing M band was detected. On further investigation, the bone marrow study confirmed the diagnosis of multiple myeloma. There are only few case reports of association of Fahr’s disease and multiple myeloma in literature. The case is being reported here in view of rarity

Influence of silver incorporation on the structural and electrical properties of diamond-like carbon thin films

A simple approach is proposed for obtaining low threshold field electron emission from large area diamond-like carbon (DLC) thin films by sandwiching either Ag dots or a thin Ag layer between DLC and nitrogen-containing DLC films. The introduction of silver and nitrogen is found to reduce the threshold field for emission to under 6 V/μm representing a near 46% reduction when compared with unmodified films. The reduction in the threshold field is correlated with the morphology, microstructure, interface, and bonding environment of the films. We find modifications to the structure of the DLC films through promotion of metal-induced sp bonding and the introduction of surface asperities, which significantly reduce the value of the threshold field. This can lead to the next-generation, large-area simple and inexpensive field emission devices. © 2013 American Chemical Society

Structural and electronic characterization of nanocrystalline diamondlike carbon thin films

The origin of low threshold field-emission (threshold field 1.25 V/μm) in nanocrystalline diamond-like carbon (nc-DLC) thin films is examined. The introduction of nitrogen and thermal annealing are both observed to change the threshold field and these changes are correlated with changes to the film microstructure. A range of different techniques including micro-Raman and infrared spectroscopy, X-ray diffraction, electron microscopy, energy-dispersive X-ray analysis and time-of-flight-secondary ion mass spectroscopy are used to examine the properties of the films. A comparison of the field emission properties of nc-DLC films with atomically smooth amorphous DLC (a-DLC) films reveals that nc-DLC films have lower threshold fields. Our results show that nc-DLC can be a good candidate for large area field emission display panels and cold cathode emission devices. © 2012 American Chemical Society

Structural and electronic characterization of nanocrystalline diamondlike carbon thin films

The origin of low threshold field-emission (threshold field 1.25 V/μm) in nanocrystalline diamond-like carbon (nc-DLC) thin films is examined. The introduction of nitrogen and thermal annealing are both observed to change the threshold field and these changes are correlated with changes to the film microstructure. A range of different techniques including micro-Raman and infrared spectroscopy, X-ray diffraction, electron microscopy, energy-dispersive X-ray analysis and time-of-flight-secondary ion mass spectroscopy are used to examine the properties of the films. A comparison of the field emission properties of nc-DLC films with atomically smooth amorphous DLC (a-DLC) films reveals that nc-DLC films have lower threshold fields. Our results show that nc-DLC can be a good candidate for large area field emission display panels and cold cathode emission devices. © 2012 American Chemical Society